Open AccessJournal Article
X-Ray Interactions: Photoabsorption, Scattering, Transmission and Reflection E = 50-30,000 eV, Z = 1-92
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This article is published in Atomic Data and Nuclear Data Tables.The article was published on 1993-03-01 and is currently open access. It has received 316 citations till now. The article focuses on the topics: Reflection (mathematics) & Scattering.read more
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Journal ArticleDOI
Multilayer mirror technology for soft-x-ray projection lithography
TL;DR: Graded multilayer coatings can be used to modify the figure of optical substrates without increasing the surface roughness, and offers a potential method for precise fabrication of aspheric imaging optics.
Journal ArticleDOI
Molybdenum/beryllium multilayer mirrors for normal incidence in the extreme ultraviolet.
Kenneth M. Skulina,C S Alford,Richard M. Bionta,D. M. Makowiecki,Eric M. Gullikson,Regina Soufli,Jeffrey B. Kortright,James H. Underwood +7 more
TL;DR: This work reports on a series of normal-incidence reflectance measurements at wavelengths just longer than the beryllium K-edge from molybdenum/beryllium multilayer mirrors that are to be demonstrated in the 1-80-nm spectral range.
Proceedings ArticleDOI
Filter windows for EUV lithography
TL;DR: In this paper, the in and out-of-band transmittance has been measured and found to meet Sandia's performance specifications, and they have been exposed to various environments with good results.
Journal ArticleDOI
Search for Dark Matter Particle Interactions with Electron Final States with DarkSide-50.
T. D. C. P. Agnes,I. Albuquerque,Thomas Alexander,A. Alton,M. Ave,H. O. Back,G. Batignani,K. Biery,V. Bocci,W. Bonivento,B. Bottino,Severino Angelo Maria Bussino,M. Cadeddu,Mariano Cadoni,Frank Calaprice,A. Caminata,Miguel D. Campos,N. Canci,M. Caravati,M. Cariello,M. Carlini,M. Carpinelli,Vittorio Cataudella,P. Cavalcante,Stefano Cavuoti,S. M. Chashin,A. S. Chepurnov,C. Cicalo,Giovanni Covone,D. D'Angelo,S. Davini,A. de Candia,S. De Cecco,G. De Filippis,G. De Rosa,A. V. Derbin,A. Devoto,M. D'Incecco,C. Dionisi,F. Dordei,Mark Downing,Domenico D׳Urso,G. Fiorillo,D. Franco,F. Gabriele,Cristiano Galbiati,C. Ghiano,C. Giganti,G. K. Giovanetti,A. M. Goretti,Giovanni Grilli di Cortona,A. V. Grobov,M. Gromov,Min-Xin Guan,Marisa Gulino,B. R. Hackett,K. Herner,Tracey Hessel,B. Hosseini,Fabrice Hubaut,E. V. Hungerford,An. Ianni,Valerio Ippolito,K. J. Keeter,C. L. Kendziora,M. Kimura,I. Kochanek,D. Korablev,G. Korga,A. S. Kubankin,M. Kuss,M. La Commara,M. Lai,X. Li,Marcello Lissia,G. Longo,O. V. Lychagina,I. N. Machulin,Livio Mapelli,Stefano Maria Mari,J. Maricic,C. J. Martoff,Andrea Messina,R. Milincic,Jocelyn Monroe,Matteo Morrocchi,Xavier Mougeot,V. N. Muratova,Paolo Musico,A. O. Nozdrina,A. Oleinik,Fausto Ortica,Luca Pagani,Marco Pallavicini,Luciano Pandola,E. Pantic,E. Paoloni,K. Pelczar,Nicomede Pelliccia,Stefano Piacentini,E. Picciau,A. Pocar,D. M. Poehlmann,S. Pordes,S. Poudel,Pascal Pralavorio,Dottie Price,Francesco Ragusa,M. Razeti,A. Razeto,A. L. Renshaw,M. Rescigno,J. Rode,A Romani,D. Sablone,O. Samoylov,W. Sands,S. Sanfilippo,Elissa Sanford,C. Savarese,B. Schlitzer,D. A. Semenov,A.V. Shchagin,A. Sheshukov,M. D. Skorokhvatov,Oleg Smirnov,A. Sotnikov,S. Stracka,Y. Suvorov,R. Tartaglia,G. Testera,A. Tonazzo,E. V. Unzhakov,A. Vishneva,R. B. Vogelaar,M. Wada,H. Wang,Yu Wang,S. Westerdale,M. M. Wojcik,Xiaozhou Liao,C. Yang,G. Zuzel +142 more
TL;DR: A search for dark matter particles with sub- GeV /c 2 masses whose interactions have final state electrons using the DarkSide-50 experiment’s low-radioactivity liquid argon exposure is presented.
Journal ArticleDOI
Reference-free evaluation of thin films mass thickness and composition through energy dispersive X-ray spectroscopy
TL;DR: In this paper, a new method for the evaluation of thin films mass thickness and composition based on the Energy Dispersive X-Ray Spectroscopy (EDS) was proposed, which exploits the theoretical calculation of the in-depth characteristic X-ray generation distribution function (ϕ(ρz)) in multilayer samples.