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Journal ArticleDOI

Zone-axis back-scattered electron contrast for fast electrons

TLDR
In this article, a dependent Bloch wave theory for inelastic scattering is adapted to predict back-scattered electron (BSE) contrast from perfect crystals, which is correlated with 300 keV data from a number of zone axes from spinel, chromia, silicon, aluminium and gallium arsenide.
Abstract
A dependent Bloch wave theory for inelastic scattering is adapted to predict back-scattered electron (BSE) contrast from perfect crystals. This is correlated with 300 keV data from a number of zone axes from spinel, chromia, silicon, aluminium and gallium arsenide. This theory is shown to supersede an independent Bloch wave theory for BSE contrast which is incapable of accounting for asymmetry across polar axes. The orientation dependence of thermal dechannelling of fast electrons is shown to be important. The BSE scattering potential is shown to approximate to a delta function scaled by the atomic number squared on each atom.

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Citations
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Journal ArticleDOI

Theory and application of electron channelling contrast imaging under controlled diffraction conditions

TL;DR: In this paper, the authors present a simple, yet instructive and demonstrative treatment of the theory of ECC of lattice defects based on Bloch wave theory using a two-beam approach.
Journal ArticleDOI

Electron diffraction based techniques in scanning electron microscopy of bulk materials

TL;DR: In this article, the three scanning electron microscope diffraction based techniques of electron channelling patterns (ECPs), electron chanelling constrast imaging (ECCI), and electron backscatter diffraction (EBSD) are reviewed.
Journal ArticleDOI

Lattice-resolution contrast from a focused coherent electron probe. Part I.

TL;DR: It is shown explicitly how mixed dynamic form factors for incoherent scattering should be taken into account for annular dark field or backscattered electron detectors, as well as for characteristic losses detected by X-ray emissions or by electron energy loss spectroscopy.
Journal ArticleDOI

Many-beam dynamical simulation of electron backscatter diffraction patterns

TL;DR: This work presents an approach for the simulation of complete electron backscatter diffraction (EBSD) patterns where the relative intensity distributions in the patterns are accurately reproduced.
Journal ArticleDOI

Dynamical electron backscatter diffraction patterns. Part I: pattern simulations.

TL;DR: An efficient numerical scheme is introduced, based on a modified Lambert projection, for the computation of the scintillator electron count as a function of the position and orientation of the EBSD detector, which allows for the rapid computation of an individual EBSD pattern by bi-linear interpolation of a master E FreeBSD pattern.
References
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BookDOI

Transmission Electron Microscopy

TL;DR: The client would like to get a larger, approximately 3 cm in diameter, well fixed tissue sample, together with a detailed report of the clinical presentation, gross, and microscopic lesions, along with the submission of samples prepared in a similar manner by the client for processing.
Book

Transmission Electron Microscopy

Ludwig Reimer, +1 more
TL;DR: Particle Optics of Electrons as mentioned in this paper, wave and wave-optics of electrons, and wave and phase contrast of Electron Spectroscopy have been studied extensively in the literature.
Journal ArticleDOI

High-resolution Z-contrast imaging of crystals

TL;DR: In this article, the use of a high-angle annular detector in a scanning transmission electron microscope is shown to provide incoherent images of crystalline materials with strong compositional sensitivity.
Journal ArticleDOI

Absorptive form factors for high-energy electron diffraction

TL;DR: In this paper, the absorptive contribution of high-energy electron diffraction to the atomic form factor has been calculated using the Debye-Waller factor, which is calculated as a function of scattering vector s and temperature factor M on a grid which enables polynomial interpolation of the results to be accurate to better than 2% for much of the ranges 0 ≤ M ≤ 2 A2.
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