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Alain Cappy
Researcher at Centre national de la recherche scientifique
Publications - 105
Citations - 4037
Alain Cappy is an academic researcher from Centre national de la recherche scientifique. The author has contributed to research in topics: High-electron-mobility transistor & Noise figure. The author has an hindex of 27, co-authored 103 publications receiving 3856 citations. Previous affiliations of Alain Cappy include University of Warsaw.
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A new method for determining the FET small-signal equivalent circuit
TL;DR: In this article, a method to determine the small-signal equivalent circuit of FETs is proposed, which consists of a direct determination of both the extrinsic and intrinsic small signal parameters in a low-frequency band.
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Resonant and voltage-tunable terahertz detection in InGaAs /InP nanometer transistors
A. El Fatimy,Frederic Teppe,Nina Dyakonova,Wojciech Knap,Dalius Seliuta,Gintaras Valušis,Andrey Shchepetov,Yannick Roelens,Sylvain Bollaert,Alain Cappy,Sergey Rumyantsev +10 more
TL;DR: In this article, high electron mobility nanometer InGaAs∕AlInAs transistors were used to detect terahertz radiation at 1.8-3.1THz frequency range.
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Modeling of a submicrometer gate field‐effect transistor including effects of nonstationary electron dynamics
TL;DR: In this paper, a simple self-consistent model is described, which takes into account nonstationary electron-dynamic effects and gate edge effects in submicrometer gate FET devices.
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Voltage tuneable terahertz emission from a ballistic nanometer InGaAs∕InAlAs transistor
J. Lusakowski,Wojciech Knap,Nina Dyakonova,Luca Varani,Javier Mateos,Tomas Gonzalez,Y. Roelens,Sylvain Bollaert,Alain Cappy,Krzysztof Karpierz +9 more
TL;DR: In this paper, a threshold-like emission from InGaAs∕InAlAs lattice-matched high electron mobility transistors was observed in a thresholdlike manner when the applied drain-to-source voltage UDS is larger than a threshold value UTH.
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A 4-fJ/Spike Artificial Neuron in 65 nm CMOS Technology.
Ilias Sourikopoulos,Sara Hedayat,Christophe Loyez,Francois Danneville,Virginie Hoel,E. Mercier,Alain Cappy +6 more
TL;DR: The most important feature of the fabricated circuits is the energy efficiency of a few femtojoules per spike, which improves prior state-of-the-art by two to three orders of magnitude.