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Christoph J. Brabec

Researcher at University of Erlangen-Nuremberg

Publications -  993
Citations -  78466

Christoph J. Brabec is an academic researcher from University of Erlangen-Nuremberg. The author has contributed to research in topics: Organic solar cell & Polymer solar cell. The author has an hindex of 120, co-authored 896 publications receiving 68188 citations. Previous affiliations of Christoph J. Brabec include Johannes Kepler University of Linz & Osram Opto Semiconductors GmbH.

Papers
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Quantifying the Energy Losses in CsPbI2Br Perovskite Solar Cells with an Open-Circuit Voltage of up to 1.45 V

TL;DR: In this paper , the authors demonstrate that adding lead acetate to the CsPbI2Br precursor allows to substantially reduce losses due to nonradiative recombination, and further analyze the strategies to reduce the residual losses in order to push the efficiency beyond the 90% theoretical limit.
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Er3+: emission from organic complexes embedded in thin polymer films

TL;DR: In this article, the luminescence spectroscopy of Er 3+ complexes with 2,2'-Bipyridine, 1,10-Phenantroline, 2-dithienyl-2,2-bipyridazine ligands, embedded in thin films of poly(methylmethacrylate) (PMMA) as well as in films of a conjugated polymer, poly[2-methoxy, 5-(3',7' -dimethyl-octyloxy)]-p-phenylene vinylene (
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Analytical model for light modulating impedance spectroscopy (LIMIS) in all-solid-state p-n junction solar cells at open-circuit

TL;DR: In this article, a photoimpedance signal named "light intensity modulated impedance spectroscopy" (LIMIS = IMVS/IMPS) is analyzed, and its difference with respect to IS suggests a correlation with the surface charge carrier recombination velocity.
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Traps and transport resistance are the next frontiers for stable non-fullerene acceptor solar cells

TL;DR: In this paper , degradation mechanisms of inverted photovoltaic devices were investigated and two distinct degradation pathways were identified: one requires the presence of both illumination and oxygen and features a short-circuit current reduction, the other one is induced thermally and marked by severe losses of open-circuits voltage and fill factor.