F
F. Freudenberg
Researcher at Technische Universität München
Publications - 4
Citations - 950
F. Freudenberg is an academic researcher from Technische Universität München. The author has contributed to research in topics: Band gap & Ellipsometry. The author has an hindex of 4, co-authored 4 publications receiving 889 citations.
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Journal ArticleDOI
Optical constants of epitaxial AlGaN films and their temperature dependence
D. Brunner,H. Angerer,E. Bustarret,F. Freudenberg,R. Höpler,Roman Dimitrov,Oliver Ambacher,Martin Stutzmann +7 more
TL;DR: In this paper, the authors studied the dependence of the absorption edge and the refractive index of wurtzite AlxGa1−xN films on temperature and composition using transmission and photothermal deflection spectroscopy.
Journal ArticleDOI
Determination of the Al mole fraction and the band gap bowing of epitaxial AlxGa1−xN films
H. Angerer,D. Brunner,F. Freudenberg,Oliver Ambacher,Martin Stutzmann,R. Höpler,T. Metzger,E. Born,Günther Dollinger,Andreas Bergmaier,S. Karsch,H. J. Körner +11 more
TL;DR: In this article, the exact Al mole fraction and the biaxial strain of the alloys can be calculated by an additional determination of a, using asymmetric reflections, and the results obtained by x-ray diffraction and elastic recoil detection provide evidence for the validity of Vegard's law in the AlGaN system.
Journal ArticleDOI
Properties and applications of MBE grown AlGaN
Martin Stutzmann,Oliver Ambacher,A. Cros,Martin S. Brandt,H. Angerer,Roman Dimitrov,N. M. Reinacher,T. Metzger,R. Höpler,D. Brunner,F. Freudenberg,R. Handschuh,Ch Deger +12 more
TL;DR: In this article, the authors used spin resonance to study the dependence of intrinsic paramagnetic defects on Al mole fraction and found that doping with Si and Mg is increasingly difficult with increasing Al content because of a continuous shift of the donor and acceptor levels deeper into the bandgap.
Journal ArticleDOI
AlGaN-Based Bragg Reflectors
Oliver Ambacher,M. Arzberger,D. Brunner,H. Angerer,F. Freudenberg,Norbert Esser,T. Wethkamp,K. Wilmers,Wolfgang Richter,Martin Stutzmann +9 more
TL;DR: In this paper, the dependence of the absorption edge and the refractive index of wurtzite AlxGa1-xN films on composition using transmission, ellipsometry and photothermal deflection spectroscopy was studied.