H
Hanpei Koike
Researcher at National Institute of Advanced Industrial Science and Technology
Publications - 85
Citations - 647
Hanpei Koike is an academic researcher from National Institute of Advanced Industrial Science and Technology. The author has contributed to research in topics: Transistor & Threshold voltage. The author has an hindex of 12, co-authored 84 publications receiving 609 citations.
Papers
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Journal ArticleDOI
Demonstration, analysis, and device design considerations for independent DG MOSFETs
M. Masahara,Yongxun Liu,Kunihiro Sakamoto,Kazuhiko Endo,Takashi Matsukawa,K. Ishii,Toshihiro Sekigawa,Hiromi Yamauchi,Hisao Tanoue,Seigo Kanemaru,Hanpei Koike,Eiichi Suzuki +11 more
TL;DR: In this paper, a comprehensive study on the controllability of four-terminal-driven double-gate (DG) MOSFETs with independently switched DGs is presented.
Journal ArticleDOI
Design Optimization of FinFET Domino Logic Considering the Width Quantization Property
TL;DR: A novel methodology for FinFET-based keeper design is introduced, which exploits the exclusive property ofFinFET devices (capacitive coupling between the front gate and the back gate in a four-terminal FinFet) to simultaneously achieve higher performance and lower power consumption.
Patent
Method for application of gating signal in insulated double gate FET
TL;DR: In this article, the threshold voltage during the operation of a transient response thereof is enabled to be arbitrarily and accurately controlled by a method that includes applying a first input signal intended to perform an ordinary logic operation to one of the gate electrodes thereof and applying, in response to this signal, a second signal that has a signal-level temporal-change direction as the first signal and has at least one of low level and high level thereof shifted by a predetermined magnitude or endowed with a predetermined time difference or has the time slower or faster signal level change of the signal to the other gate electrode.
Proceedings ArticleDOI
Characterization of metal-gate FinFET variability based on measurements and compact model analyses
Shin-ichi O'uchi,Takashi Matsukawa,Tadashi Nakagawa,Kazuhiko Endo,Y. X. Liu,Toshihiro Sekigawa,Junichi Tsukada,Yoshie Ishikawa,Hiromi Yamauchi,K. Ishii,Eiichi Suzuki,Hanpei Koike,Kunihiro Sakamoto,M. Masahara +13 more
TL;DR: In this article, the Vth variation of the MG FinFETs was analyzed into structure-based (TSi, LG) and material-based variations for the first time, and the extracted variations were incorporated into the compact model.
Proceedings ArticleDOI
Performance and yield enhancement of FPGAs with within-die variation using multiple configurations
Yohei Matsumoto,Masakazu Hioki,Takashi Kawanami,Toshiyuki Tsutsumi,Tadashi Nakagawa,Toshihiro Sekigawa,Hanpei Koike +6 more
TL;DR: A new method for improving the timing yield of field-programmable gate array (FPGA) devices affected by random within-die variation is proposed, which does not require the measurement of process variations and execution of design tools for each chip.