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Heinz Siegwart

Researcher at IBM

Publications -  43
Citations -  1653

Heinz Siegwart is an academic researcher from IBM. The author has contributed to research in topics: Epitaxy & Thin film. The author has an hindex of 19, co-authored 42 publications receiving 1481 citations.

Papers
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Direct observation of the alignment of ferromagnetic spins by antiferromagnetic spins

TL;DR: P polarization-dependent X-ray magnetic dichroism spectro-microscopy is presented that reveals the micromagnetic structure on both sides of a ferromagnetic–antiferromagnetic interface, implying that the alignment of the ferrom magnetic spins is determined, domain by domain, by the spin directions in the underlying antiferromagnet layer.
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Observation of antiferromagnetic domains in epitaxial thin films

TL;DR: These studies open the door for a microscopic understanding of the magnetic coupling across antiferromagnetic-ferromagnetic interfaces.
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Field-effect transistors with SrHfO3 as gate oxide

TL;DR: In this article, the authors demonstrate that the compound SrHfO3 grown epitaxially on Si(100) by molecular-beam epitaxy is a potential gate dielectric to fabricate n- and p-metaloxide semiconductor field effect transistors with equivalent oxide thickness (EOT) below 1nm.
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An integrated optical modulator operating at cryogenic temperatures.

TL;DR: Electro-optic switching and modulation from room temperature down to 4 K is demonstrated by using the Pockels effect in integrated barium titanate (BaTiO3) devices, removing major roadblocks for the realization of cryogenic-compatible systems in the field of quantum computing, supercomputing and sensing.
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Optical properties of epitaxial SrHfO3 thin films grown on Si

TL;DR: In this article, perovskite thin films of SrHfO3 were grown by molecular beam epitaxy and compared with SrTiO3 films using spectroscopic ellipsometry and analyzed with respect to their structural properties characterized by x-ray diffractometry, atomic force microscopy, and transmission electron microscopy.