J
Julien Bailat
Researcher at University of Neuchâtel
Publications - 71
Citations - 3058
Julien Bailat is an academic researcher from University of Neuchâtel. The author has contributed to research in topics: Silicon & Micromorph. The author has an hindex of 22, co-authored 71 publications receiving 2920 citations. Previous affiliations of Julien Bailat include Swiss Center for Electronics and Microtechnology.
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Thin‐film silicon solar cell technology
Arvind Shah,Horst Schade,Milan Vanecek,Johannes Meier,Evelyne Vallat-Sauvain,Nicolas Wyrsch,Ulrich Kroll,C. Droz,Julien Bailat +8 more
TL;DR: In this article, the authors describe the use of hydrogenated amorphous silicon (a-Si:H) and hydrogenated micro-crystalline silicon (μc-Si-H) thin films (layers), both deposited at low temperatures (200°C) by plasma-assisted chemical vapour deposition (PECVD), from a mixture of silane and hydrogen.
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Organic-inorganic halide perovskite/crystalline silicon four-terminal tandem solar cells
Philipp Löper,Soo-Jin Moon,Silvia Martin de Nicolas,Bjoern Niesen,Martin Ledinsky,Martin Ledinsky,Sylvain Nicolay,Julien Bailat,Jun-Ho Yum,Stefaan De Wolf,Christophe Ballif +10 more
TL;DR: A four-terminal tandem solar cell consisting of a methyl ammonium lead triiodide top cell and a c-Si heterojunction bottom cell that exhibits broad-band transparency owing to its design free of metallic components and yields a transmittance of >55% in the near-infrared spectral region is presented.
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In situ silicon oxide based intermediate reflector for thin-film silicon micromorph solar cells
Peter Buehlmann,Julien Bailat,Didier Domine,Adrian Billet,F. Meillaud,Andrea Feltrin,Christophe Ballif +6 more
TL;DR: In this paper, SiO-based intermediate reflectors (SOIRs) can be fabricated in the same reactor and with the same process gases as used for thin-film silicon solar cells.
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Relationship between Raman crystallinity and open-circuit voltage in microcrystalline silicon solar cells
TL;DR: A series of nip-type microcrystalline silicon (mc-Si:H) single-junction solar cells has been studied by electrical characterisation, by transmission electron microscopy (TEM) and by Raman spectroscopy using 514 and 633 nm excitation light and both top and bottomillumination as discussed by the authors.
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Relation between substrate surface morphology and microcrystalline silicon solar cell performance
M. Python,Evelyne Vallat-Sauvain,Julien Bailat,Didier Domine,L. Fesquet,Arvind Shah,Christophe Ballif +6 more
TL;DR: In this paper, the structural and electrical performances of microcrystalline silicon (μc-Si:H) single junction solar cells co-deposited on a series of substrates having different surface morphologies varying from V-shaped to U-shaped valleys, are analyzed Transmission electron microscopy (TEM) is used to quantify the density of cracks within the cells.