M
M. Meissl
Researcher at University of Texas at Austin
Publications - 5
Citations - 724
M. Meissl is an academic researcher from University of Texas at Austin. The author has contributed to research in topics: Lithography & Resist. The author has an hindex of 4, co-authored 5 publications receiving 716 citations.
Papers
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Journal ArticleDOI
Step and flash imprint lithography: Template surface treatment and defect analysis
Todd Bailey,Byung Jin Choi,Matthew E. Colburn,M. Meissl,S. Shaya,John G. Ekerdt,Sidlgata V. Sreenivasan,Carlton G Willson +7 more
TL;DR: In this paper, an automated tool for step and flash imprint lithography was constructed to allow defect studies by making multiple imprints on a 200 mm wafer, and the imprint templates for this study were treated with a low surface energy, self-assembled monolayer to ensure selective release at the template-etch barrier interface.
Journal ArticleDOI
Step and flash imprint lithography: Defect analysis
Todd Bailey,Britain J. Smith,Byung Jin Choi,Matthew E. Colburn,M. Meissl,Sidlgata V. Sreenivasan,John G. Ekerdt,Carlton G Willson +7 more
TL;DR: Inspection of an imprint template before and after imprinting revealed that the template actually becomes cleaner with imprinting, and visual inspection of multiple imprints did not reveal any systematic generation or propagation of defects.
Journal ArticleDOI
Template fabrication schemes for step and flash imprint lithography
Todd Bailey,D. J. Resnick,David P. Mancini,Kevin J. Nordquist,William J. Dauksher,Eric S. Ainley,A. Alec Talin,K. Gehoski,Jeffrey H. Baker,Byung Jin Choi,S. Johnson,Matthew E. Colburn,M. Meissl,Sidlgata V. Sreenivasan,John G. Ekerdt,Carlton G Willson +15 more
TL;DR: In this article, the authors investigate alternative processes for defining features on an SFIL template using a much thinner template, which has the advantage that the template is transparent, thereby facilitating conventional overlay techniques.
Step and Flash Imprint Lithography: A Technology Review
Todd Bailey,B. J. Choi,Matthew E. Colburn,Annette Grot,M. Meissl,Michael D. Stewart,John G. Ekerdt,Sidlgata V. Sreenivasan,Carlton G Willson +8 more
TL;DR: Step and Flash Imprint Lithography (SFIL) as mentioned in this paper uses a rigid, UV-transparent imprint template, and a bilayer resist scheme composed of an organic planarizing layer and a low viscosity, UVcurable organosilicon solution for imprint imaging.
Book ChapterDOI
Precision Flexure Mechanisms in High Speed Nanopatterning Systems
TL;DR: In this article, the authors integrate nano-scale precision mechanisms with advanced optical and mechatronic modules to achieve highly controlled nanopatterning capability for fabricating advanced integrated circuits, photonics, and optoelectronic devices.