Step and flash imprint lithography: Defect analysis

TLDR: Inspection of an imprint template before and after imprinting revealed that the template actually becomes cleaner with imprinting, and visual inspection of multiple imprints did not reveal any systematic generation or propagation of defects.

Abstract: Step and flash imprint lithography (SFIL) is a promising, low cost alternative to projection printing. This technique has demonstrated very high resolution and overlay alignment capabilities, but it is a contact printing technique so there is concern about defect generation and propagation. A series of experiments has been carried out with the goal of quantifying the effect of defect propagation. To that end, each unit process in SFIL was studied independently. The number of particles added during handling and transportation and due to SFIL machinery was deemed acceptable, and the added particles should not complicate the inspection of process defects. The concept of a “self-cleaning” process in which the imprint template becomes cleaner by imprinting was revisited. Inspection of an imprint template before and after imprinting revealed that the template actually becomes cleaner with imprinting. Visual inspection of multiple imprints did not reveal any systematic generation or propagation of defects. The inspection area used in this study was limited, however, since the inspection was both manual and visual. Imprinting for this defect study was performed at the University of Texas in a Class 10 cleanroom, and inspection was performed at International SEMATECH.