M
Miro Zeman
Researcher at Delft University of Technology
Publications - 455
Citations - 10476
Miro Zeman is an academic researcher from Delft University of Technology. The author has contributed to research in topics: Silicon & Solar cell. The author has an hindex of 46, co-authored 426 publications receiving 9010 citations. Previous affiliations of Miro Zeman include Academy of Sciences of the Czech Republic & Cochin University of Science and Technology.
Papers
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Journal ArticleDOI
Positron annihilation depth‐profiling as a promising tool for the structural analysis of light‐soaked a‐Si:H absorber layers
TL;DR: In this paper, a positron annihilation depth profiling is applied as a sensitive probe to investigate the defect evolution of hydrogenated amorphous silicon (a-Si:H) absorber layers fabricated by the PE-CVD method with typical thicknesses of 300-500 nm.
Proceedings ArticleDOI
Impact of Interface Passivation on the Band Alignment of a-Si:H(n)/c-Si(p) Heterostructure Solar Cells
Journal ArticleDOI
Modeling of a-Si:H Alloy Solar Cells on Textured Substrates
Miro Zeman,J. H. van den Berg,L. L. A. Vosteen,J.A. Willemen,J.W. Metselaar,Ruud E. I. Schropp +5 more
TL;DR: In this paper, the authors developed a multi-rough-interface optical model GENPRO2 which was used for calculating the absorption profiles in the solar cells, and the results of a sensitivity study of the parameters of this optical model such as the scattering coefficients of the reflected and transmitted light and the dependence of scattered light on the in-going and out-going angle are presented.
Journal ArticleDOI
Evolution of Charged Gap Statesin a - Si:H Under Light Exposure
TL;DR: In this paper, the authors identify three different types of defects from the charge deep-level transient spectroscopy (Q-DLTS) experiments on undoped hydrogenated amorphous silicon (a-Si:H).