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Miro Zeman

Researcher at Delft University of Technology

Publications -  455
Citations -  10476

Miro Zeman is an academic researcher from Delft University of Technology. The author has contributed to research in topics: Silicon & Solar cell. The author has an hindex of 46, co-authored 426 publications receiving 9010 citations. Previous affiliations of Miro Zeman include Academy of Sciences of the Czech Republic & Cochin University of Science and Technology.

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Journal ArticleDOI

Modeling of Advanced Light Trapping Approaches in Thin-Film Silicon Solar Cells

TL;DR: In this paper, the ASA program was used to study two different types of thin-film silicon solar cells, and the role of computer modeling for analyzing and designing these devices becomes increasingly important.
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Electrochemical Oxidation of Organic Pollutants Powered by a Silicon-Based Solar Cell.

TL;DR: In this paper, the authors aim at decoupling the trade-off between low-pollutant concentration and costs for water treatment, and propose an approach that decouples these two variables.
Journal Article

Optical characterization of poly-SiO x and poly-SiC x carrier-selective passivating contacts

TL;DR: In this article, the absorption coefficient of doped poly-SiOx and polySiCx layers as function of oxygen and carbon content, respectively, was obtained for wavelengths (300-2000 nm) by means of two alternative techniques.
Journal ArticleDOI

Hydrogenated amorphous silicon oxide (a-SiOx:H) single junction solar cell with 8.8% initial efficiency by reducing parasitic absorptions

TL;DR: In this paper, the authors carried out optical simulations to find the main optical losses for the a-SiOx:H solar cell, which so far was mainly optimized for Voc and fill-factor (FF).
Proceedings ArticleDOI

Optical scattering properties of a nano-textured ZnO-silicon interface

TL;DR: This study introduces an experimental technique to access light scattering properties at textured TCO-silicon interfaces and evaluated four approximate models based on the scalar scattering theory and ray tracing and compared them to the rigorous diffraction theory.