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Mwj Menno Prins

Researcher at Radboud University Nijmegen

Publications -  30
Citations -  2946

Mwj Menno Prins is an academic researcher from Radboud University Nijmegen. The author has contributed to research in topics: Semiconductor & Quantum tunnelling. The author has an hindex of 18, co-authored 30 publications receiving 2888 citations. Previous affiliations of Mwj Menno Prins include Philips & Delft University of Technology.

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A ferroelectric transparent thin‐film transistor

TL;DR: In this paper, a field-effect transistor made of transparant oxidic thin films, showing an intrinsic memory function due to the usage of a ferroelectric insulator.
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Reversible electrowetting and trapping of charge : model and experiments

Hjj Verheijen, +1 more
- 09 Sep 1999 - 
TL;DR: In this paper, the authors derive a model for voltage-induced wetting, so-called electrowetting, from the principle of virtual displacement, including the possibility that charge is trapped in or on the wetted su...
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Fluid control in multichannel structures by electrocapillary pressure.

TL;DR: Control of fluid motion in three-dimensional structures with thousands of microch channels is demonstrated via an electrocapillary pressure, originating from electrostatic control of the solid/fluid interfacial tension in the microchannels.
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Thickness dependence of the switching voltage in all-oxide ferroelectric thin-film capacitors prepared by pulsed laser deposition

TL;DR: In this article, the authors show that charge injection can explain the experimentally observed increase of coercive field with decreasing ferroelectric layer thickness, which is comparable with values for bulk ceramics, and a good endurance up to 1011 cycles have been observed for epitaxial and textured capacitors with oxidic electrodes.
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Interface magnetism and possible quantum well oscillations in ultrathin Co/Cu films observed by magnetization induced second harmonic generation.

TL;DR: Very strong oscillations in the MSHG signal are found for the Cu/Co/Cu system as a function of the thickness of the Cu coverlayer, which are possibly related to quantum well states in these thin Cu films.