O
Olivier Duhamel
Researcher at French Alternative Energies and Atomic Energy Commission
Publications - 60
Citations - 875
Olivier Duhamel is an academic researcher from French Alternative Energies and Atomic Energy Commission. The author has contributed to research in topics: Optical fiber & Silicon on insulator. The author has an hindex of 15, co-authored 54 publications receiving 732 citations.
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Journal ArticleDOI
New Insights Into Single Event Transient Propagation in Chains of Inverters—Evidence for Propagation-Induced Pulse Broadening
V. Ferlet-Cavrois,P. Paillet,Dale McMorrow,N. Fel,J. Baggio,Sylvain Girard,Olivier Duhamel,Joseph S. Melinger,Marc Gaillardin,J.R. Schwank,Paul E. Dodd,Marty R. Shaneyfelt,J.A. Felix +12 more
TL;DR: In this article, the generation and propagation of single event transients (SET) in SOI inverter chains with different designs is measured and modeled in a single-input single-output (SISO) system.
Journal ArticleDOI
Investigation of the Propagation Induced Pulse Broadening (PIPB) Effect on Single Event Transients in SOI and Bulk Inverter Chains
V.F. Cavrois,Vincent Pouget,Dale McMorrow,J.R. Schwank,N. Fel,F. Essely,Richard S. Flores,P. Paillet,M. Gaillardin,Daisuke Kobayashi,Joseph S. Melinger,Olivier Duhamel,Paul E. Dodd,Marty R. Shaneyfelt +13 more
TL;DR: In this article, the propagation-induced pulse broadening (PIPB) effect is shown to determine the SET pulse width measured at the output of long chains of inverters after irradiation.
Journal ArticleDOI
Impact of SOI Substrate on the Radiation Response of UltraThin Transistors Down to the 20 nm Node
Marc Gaillardin,M. Martinez,Philippe Paillet,Francois Andrieu,Sylvain Girard,Melanie Raine,Claude Marcandella,Olivier Duhamel,Nicolas Richard,O. Faynot +9 more
TL;DR: In this paper, the authors investigated the total ionizing dose (TID) response of an UltraThin Buried-OXide (UTBOX) on a Fully Depleted Silicon-On-Insulator (FDSOI) high-k/metal gate technology.
Journal ArticleDOI
Single Event Upsets Induced by 1–10 MeV Neutrons in Static-RAMs Using Mono-Energetic Neutron Sources
TL;DR: In this article, the authors investigated the effect of alpha particles coming from (n, alpha) reactions on the SEU sensitivity of neutrons in the 1-10 MeV energy range using monoenergetic neutron beams at 2.5, 4, 6, and 14 MeV.
Journal ArticleDOI
Heavy Ion Microbeam- and Broadbeam-Induced Transients in SiGe HBTs
Jonathan A. Pellish,Robert A. Reed,Dale McMorrow,Gyorgy Vizkelethy,V.F. Cavrois,J. Baggio,P. Paillet,Olivier Duhamel,Kurt A. Moen,S.D. Phillips,R.M. Diestelhorst,John D. Cressler,Akil K. Sutton,Ashok Raman,Marek Turowski,Paul E. Dodd,Michael L. Alles,Ronald D. Schrimpf,Paul W. Marshall,Ken LaBel +19 more
TL;DR: In this article, the effects of ion strike location, range, and LET were analyzed using a custom broadband IC package and real-time digital phosphor oscilloscopes with at least 16 GHz of analog bandwidth.