scispace - formally typeset
P

Philippe M. Fauchet

Researcher at Vanderbilt University

Publications -  494
Citations -  19231

Philippe M. Fauchet is an academic researcher from Vanderbilt University. The author has contributed to research in topics: Silicon & Porous silicon. The author has an hindex of 60, co-authored 494 publications receiving 18686 citations. Previous affiliations of Philippe M. Fauchet include Rochester Institute of Technology & AT&T.

Papers
More filters
Journal ArticleDOI

Micron-Size and Submicron-Size Light-Emitting Porous Silicon Structures

TL;DR: In this paper, three classes of techniques to produce micron-size and sub-micron size light emitting porous Si (LEPSi) patterns and to protect the rest of the wafer were developed.
Journal ArticleDOI

Electron time-of-flight measurements in porous silicon

TL;DR: In this article, transient photocurrent measurements are reported in an electroluminescent porous silicon diode, and drift mobilities are obtained from the data as a function of temperature, with a typical dispersion parameter α α 0.5.
Patent

Method for controlling one or more temperature dependent optical properties of a structure and a system and product thereof

TL;DR: In this article, a method for controlling one or more temperature dependent optical properties of a structure in accordance with the present invention includes heating at least a portion of a photonic band-gap structure and oxidizing the portion during the heating to alter at least one temperature-dependent optical property of the stack.
Journal ArticleDOI

Fabrication and Characterization of Light Emitting Porous Silicon and Polymer Nanocomposites

TL;DR: In this article, the fabrication of nanocomposites by the infiltration of polymers into porous silicon was reported, and the Vickers hardness arid the thermal conductivity of the samples were measured.
Journal ArticleDOI

Manufacture of Submicron Light-Emitting Porous Silicon Areas for Miniature LEDs

TL;DR: In this article, the sharpness of the interface between the porous silicon and crystalline silicon regions is characterized using a variety of mapping techniques, such as photoluminescence, atomic force and electron beam microscopies.