S
S. Tiedke
Researcher at RWTH Aachen University
Publications - 34
Citations - 2251
S. Tiedke is an academic researcher from RWTH Aachen University. The author has contributed to research in topics: Ferroelectricity & Thin film. The author has an hindex of 15, co-authored 34 publications receiving 2113 citations.
Papers
More filters
Journal ArticleDOI
Resistive switching mechanism of TiO2 thin films grown by atomic-layer deposition
Byung Joon Choi,Doo Seok Jeong,Seong Keun Kim,C. Rohde,Seol Choi,J. H. Oh,Honggon Kim,Cheol Seong Hwang,K. Szot,Rainer Waser,B. Reichenberg,S. Tiedke +11 more
TL;DR: In this article, the resistive switching mechanism of 20-to 57-nm-thick TiO2 thin films grown by atomic-layer deposition was studied by currentvoltage measurements and conductive atomic force microscopy.
Journal Article
原子層蒸着で成長したTiO 2 薄膜の抵抗スイッチング機構
Byung Joon Choi,Doo Seok Jeong,Seong Keun Kim,C. Rohde,Seol Choi,J. H. Oh,Honggon Kim,Cheol Seong Hwang,K. Szot,Rainer Waser,B. Reichenberg,S. Tiedke +11 more
Journal ArticleDOI
Dynamic leakage current compensation in ferroelectric thin-film capacitor structures
TL;DR: In this article, a measurement procedure to separate ferroelectric switching current and dielectric displacement current from the leakage current in leaky thin-film capacitor structures was proposed, and the hysteresis loop was calculated without performing a static leakage current measurement, which causes a high dc field stress to the sample.
Journal ArticleDOI
Nanosize ferroelectric oxides – tracking down the superparaelectric limit
TL;DR: In this paper, the extrinsic effects can be used to stabilize ferroelectricity and to shrink the ultimate size of a random access memory (RAM) system, but the system performance is very sensitive to the fabrication and processing procedures.
Journal ArticleDOI
Piezoelectric thin films: evaluation of electrical and electromechanical characteristics for MEMS devices
TL;DR: A new measurement method to characterize piezoelectric thin films utilizing a four-point bending setup in combination with a single- or a double-beam laser interferometer, which allows the determination of the effective transverse and longitudinal piez Zoelectric coefficients e31,f and d33,f respectively.