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Sung Heo

Researcher at Samsung

Publications -  91
Citations -  1853

Sung Heo is an academic researcher from Samsung. The author has contributed to research in topics: X-ray photoelectron spectroscopy & Band gap. The author has an hindex of 19, co-authored 85 publications receiving 1457 citations. Previous affiliations of Sung Heo include Sungkyunkwan University & École Polytechnique Fédérale de Lausanne.

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In situ observation of filamentary conducting channels in an asymmetric Ta2O5−x/TaO2−x bilayer structure

TL;DR: In situ scanning transmission electron microscope experiments verify, at the atomic scale, that the switching effects occur by the formation and annihilation of conducting channels between a top Pt electrode and a TaO2-x base layer, which consist of nanoscale TaO1-x filaments.
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Deep level trapped defect analysis in CH3NH3PbI3 perovskite solar cells by deep level transient spectroscopy

TL;DR: In this paper, the authors report the presence of defects in CH3NH3PbI3, which is one of the main factors that deteriorates the performance of perovskite solar cells.
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Full surface embedding of gold clusters on silicon nanowires for efficient capture and photothermal therapy of circulating tumor cells.

TL;DR: It is found that irradiation of breast cancer cells captured on Au NC-coated Si NWs with a near-infrared light resulted in a high mortality rate of these cancer cells, raising a fine prospect for simultaneous capture and plasmonic photothermal therapy for circulating tumor cells.
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Bandgap measurement of thin dielectric films using monochromated STEM-EELS.

TL;DR: High-resolution electron energy-loss spectroscopy (HR-EELS), achieved by attaching electron monochromators to transmission electron microscopes (TEM), has proved to be a powerful tool for measuring bandgaps but the method itself is still uncertain, due to Cerenkov loss and surface effects.
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Band gap and defect states of MgO thin films investigated using reflection electron energy loss spectroscopy

TL;DR: In this paper, the authors investigated the band gap and defect states of MgO thin films by using reflection electron energy loss spectroscopy (REELS) and high-energy resolution REELS (HR-REELS).