T
T. Merbeth
Researcher at Advanced Micro Devices
Publications - 4
Citations - 9
T. Merbeth is an academic researcher from Advanced Micro Devices. The author has contributed to research in topics: Computer science & Chip. The author has an hindex of 1, co-authored 1 publications receiving 7 citations.
Papers
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Proceedings ArticleDOI
Short-flow test chip utilizing fast testing for defect density monitoring in 45nm
M. Karthikeyan,W. Cote,Louis V. Medina,Ernesto Shiling,A. Gasasira,A. Henning,W. Ferrante,M. Craig,T. Merbeth +8 more
TL;DR: In this article, a 45 nm short-flow test chip was designed and is currently used to improve defect-limited yield, where the DC test structures are tested in parallel mode on a functional test platform, resulting in a 5x reduction in test time over conventional parametric testing.
Proceedings ArticleDOI
Extended MTJ TDDB Model, and Improved STT-MRAM Reliability With Reduced Circuit and Process Variabilities
Vinayak Bharat Naik,K. Yamane,J. Kwon,Behtash Behin-Aein,N. L. Chung,R. Chao,C. Chiang,Y. Huang,L. Pu,Yuichi Otani,S. H. Jang,N. Balasankaran,Wah-Peng Neo,Tan Yun Ling,J. W. Ting,Hongsik Yoon,Johannes Müller,B. Pfefferling,O. Kallensee,T. Merbeth,Chim Seng Seet,J. Wong,Y. S. You,Steven R. Soss,T. H. Chan,Soh Yun Siah +25 more
TL;DR: In this article , the authors present a reliable magnetic tunnel junction (MTJ) TDDB model using 40Mb 22FDX® STT-MRAM at sub-PPM failure rate.
Proceedings ArticleDOI
From Emergence to Prevalence: 22FDX® Embedded STT-MRAM
Johannes Müller,Aleksandra Titova,Hongsik Yoon,T. Merbeth,M. Weisheit,Georg Wolf,Sanjeeb Bharali,B. Pfefferling,Yuichi Otani,T. Shapoval,Alberto Cagliani,F. Vajda,Pedram Sadeghi,Christiana Villas-Boas Grimm,Frank Krause,Ines Altendorf,G. Congedo,Roberto Binder,Joachim Metzger,Alexander Lajn,Markus Langner,Y. S. You,O. Kallensee,Vinayak Bharat Naik,K. Yamane,Steven R. Soss +25 more
TL;DR: In this paper , the authors proposed a line of defense strategy for embedded STT-MRAM memory arrays by using magneto-electrical and magnetooptical techniques for drift partitioning as well as their correlation to the final wafer electrical test and reliability.
Proceedings ArticleDOI
STT-MRAM Product Reliability and Cross-Talk
Vinayak Bharat Naik,K. Yamane,J. Kwon,J. H. Lim,N. Balasankaran,N. L. Chung,L. Y. Hau,R. Chao,C. Chiang,Y. Huang,L. Pu,L. Ma,Chung-Ying Meng,Yoshiteru Otani,L. Y. Zhang,S. H. Jang,Tan Yun Ling,J. W. Ting,Hongsik Yoon,Jack H. Mueller,B. Pfefferling,O. Kallensee,T. Merbeth,Chim Seng Seet,J. Wong,Y. S. You,Steven R. Soss,T. H. Chan,Soh Yun Siah +28 more
TL;DR: The product reliability of industrial-grade (-40~125°C) 40Mb 22FDX® embedded-MRAM technology having 5x-solder reflows compatibility stack is presented and the stand-by magnetic immunity and cross-talk between MRAM and RF are also discussed.