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Institution

Osaka Institute of Technology

EducationOsaka, Japan
About: Osaka Institute of Technology is a education organization based out in Osaka, Japan. It is known for research contribution in the topics: Thin film & Laser. The organization has 2457 authors who have published 4247 publications receiving 49872 citations. The organization is also known as: Ōsaka kōgyō daigaku.


Papers
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Journal ArticleDOI
TL;DR: In this article, Ceria in subsurface fissures was completely removed using rf-magnetron sputtering without degrading surface roughness, and the laser-induced damage threshold of the optical coating on an ion-etched surface was improved by a factor of two compared to that on an unprocessed surface.
Abstract: Subsurface damage incurred during optical polishing, which is known to lower the laser damage thresholds of fused silica surfaces, was studied Ceria in subsurface fissures was completely removed (depths up to one thousand A) using rf-magnetron sputtering without degrading surface roughness The laser-induced damage threshold of the optical coating deposited on an ion-etched surface was improved by a factor of two compared to that on an unprocessed surface

22 citations

Journal ArticleDOI
TL;DR: In this article, nitrogen-doped ZnO (ZnO:N) and ZnMgO layers were grown on a plane sapphire substrates by molecular beam epitaxy (MBE).
Abstract: One of the key issues for the realization of ZnO-based enzyme modified field effect transistors (FET) is growth of a high resistive layer underneath the active layer of the device structure For that purpose, nitrogen-doped ZnO (ZnO:N) and ZnMgO layers were grown on a-plane sapphire substrates by molecular beam epitaxy (MBE) Although photoluminescence (PL) spectra indicated that nitrogen atom was incorporated as acceptor, ZnO:N layers showed still n-type conductivity probably due to generation of donor-like defects during nitrogen doping On the other hand, ZnMgO layers showed high resistive and flat surface, which will be utilized underlying layers for successive growth of ZnO-based biosensors

22 citations

Journal ArticleDOI
04 Feb 2017-Polymers
TL;DR: The PICsomes were characterized using 1H NMR, static abd dynamic light scattering, transmittance electron microscopy (TEM), and atomic force microscopy and found a spherical hollow vesicle structure was observed in TEM images.
Abstract: Diblock copolymers consisting of a hydrophilic poly(2-(methacryloyloxy)ethyl phosphorylcholine) (PMPC) block and either a cationic or anionic block were prepared from (3-(methacrylamido)propyl)trimethylammonium chloride (MAPTAC) or sodium 2-(acrylamido)-2-methylpropanesulfonate (AMPS). Polymers were synthesized via reversible addition-fragmentation chain transfer (RAFT) radical polymerization using a PMPC macro-chain transfer agent. The degree of polymerization for PMPC, cationic PMAPTAC, and anionic PAMPS blocks was 20, 190, and 196, respectively. Combining two solutions of oppositely charged diblock copolymers, PMPC-b-PMAPTAC and PMPC-b-PAMPS, led to the spontaneous formation of polyion complex vesicles (PICsomes). The PICsomes were characterized using 1H NMR, static abd dynamic light scattering, transmittance electron microscopy (TEM), and atomic force microscopy. Maximum hydrodynamic radius (Rh) for the PICsome was observed at a neutral charge balance of the cationic and anionic diblock copolymers. The Rh value and aggregation number (Nagg) of PICsomes in 0.1 M NaCl was 78.0 nm and 7770, respectively. A spherical hollow vesicle structure was observed in TEM images. The hydrodynamic size of the PICsomes increased with concentration of the diblock copolymer solutions before mixing. Thus, the size of the PICsomes can be controlled by selecting an appropriate preparation method.

22 citations

Journal ArticleDOI
TL;DR: In this article, the thermoelectromechanical fracture behavior of two coplanar cracks in a piezoelectric material strip under a uniform heat flow far away from the crack region was investigated.
Abstract: This work is concerned with the thermoelectromechanical fracture behavior of two coplanar cracks in a piezoelectric material strip under a uniform heat flow far away from the crack region. The crack faces are supposed to be insulated thermally and electrically. Fourier transforms are used to reduced the mixed boundary value problems to singular integral equations. Numerical calculations are carried out, and detailed results are presented to illustrate the influence of the geometric parameters on the thermal stress intensity factors.

22 citations

Journal ArticleDOI
TL;DR: In this paper, the first band-edge photoluminescence at 1.814 eV and two stronger emissions at 2.081 eV at 8.5 K from the respective 880 nm thick InN heteroepitaxial layers (heteroepilayers) with 10 nm thick buffer layers grown on Si(001 and Si(111) substrates by electron cyclotron resonance-assisted molecular beam epitaxy.
Abstract: For the first time, we observed strong band-edge photoluminescence at 1.814 eV, and two stronger emissions at 1.880 and 2.081 eV at 8.5 K from the respective 880 nm thick InN heteroepitaxial layers (heteroepilayers) with 10 nm thick InN buffer layers grown on Si(001) and Si(111) substrates by electron cyclotron resonance-assisted molecular beam epitaxy. The former was probably assigned as donor-to-acceptor pair (DAP(a-InN)) emission from wurtzite-InN (a-InN) crystal grains, the latter were assigned as donor bound exciton (D°X(a-InN)) emission, and D 0 X(β-InN) or DAP(β-InN) emission from zincblende-InN (β-InN) crystal grains, respectively. Substrate annealing before growth and the introduction of a buffer layer had strong influences on the crystal structure and crystalline quality of the initial InN heteroepilayers.

22 citations


Authors

Showing all 2467 results

NameH-indexPapersCitations
Yuri S. Kivshar126184579415
Qiang Xu11758550151
Steven P. Armes11261842536
Anthony J. Ryan7834022014
Kouhei Ohnishi6091117300
Juan M. Corchado5766512250
Seiji Ito522408626
Hirokazu Tamamura5132810234
Eric M. Vogel5023210408
Kenji Kamada472127044
Syuji Fujii452466379
Keiichi Kaneto442496678
Kazuyuki Tanabe431565545
Yoshihiro Ohmiya432065822
Kiyoshi Matsumura421186377
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Performance
Metrics
No. of papers from the Institution in previous years
YearPapers
20237
20229
2021153
2020188
2019198
2018217