Showing papers in "Microelectronics Reliability in 1987"

TL;DR: A self-contained method and structure for partitioning, testing and diagnosing a multi-chip packaging structure was proposed in this article, which comprises the steps of electronically inhibiting all chips in the multichannel package except for the chip or chips under test, and comparing the signature obtained to a good machine simulation signature.

TL;DR: The present paper provides a conceptually simple and computationally efficient algorithm to obtain simultaneously the paths between any single pair of terminals, paths for multiterminal pairs and the cuts for the specified terminal pair of interest of any complex network.

TL;DR: In this paper, a method for determining the thermal characteristics of a semiconductor packaging system using a platinum resistor test unit is presented, where the resistor is calibrated at a plurality of temperature levels to generate a linear temperature versus resistance graph or equation corresponding thereto.

TL;DR: Laplace transforms of state probabilities and steady-state availability of the system are developed and a mathematical model of a repairable parallel system with standby units involving human error and common-cause failures is presented.

TL;DR: A fraud-preventive device for a memory card comprising an EPROM type or similar non-volatile memory designed to receive confidential authorization data as well as the results, wrong or otherwise, of tests on the authorization data, comprises a single simulation cell designed to record the non-erroneous results.

TL;DR: In this article, the authors proposed a test region in the package body which is spaced apart from the I/O pins, the chip attach regions, the signal pads, and the first and second sets of conductors.

TL;DR: In this article, a multi-layer metallization method and structure that permits the use of sodium-ion contaminated titanium-tungsten (Ti:W) as a barrier metal with gold conductor metal on a silicon substrate, without significant degradation of device characteristics is presented.

TL;DR: In this paper, switching-algebraic techniques are utilized in a simple and instructive derivation of the linear-cost recursive relation of consecutive-k-out-of-n:F systems.

TL;DR: A semiconductor logic integrated circuit device comprising a signal selection means and a storing means, which is capable of adjusting the logic levels of an output signal therefrom, and a serial input signal to the signal selection mean is allowed to be stored in the storing means to adjust the Logic levels of the output signal from the circuit device at desired levels voluntarily.

TL;DR: In this article, the stochastic analysis of a single server two identical unit cold standby system was carried out under the assumption that failure time distributions are negative exponential, whereas inspection, preparation time for repair and repair time distributions were arbitrary.

TL;DR: In this paper, a software reliability growth model with testing-effort based on a nonhomogeneous Poisson process and its application to a testingeffort control problem is discussed.

TL;DR: In this article, an efficient method for enumeration of all paths for terminal and multiterminal pairs of directed, as well as undirected graphs is presented, where paths are enumerated with the help of the connection matrix/adjacency matrix using a graph theory approach.

TL;DR: An optimal algorithm for computing the reliability of a k-to-l-out-of-n:G system with non-identical components with coefficients in the range of n is developed.

TL;DR: In this article, the authors proposed a method for establishing an exact confidence interval for availability under the assumption that the time between failures and the time to repair are independent gamma and lognormal random variables respectively.

TL;DR: In this article, the authors considered networks whose arcs may experience two failure modes, an open failure and a short failure, in addition to the normal "success" state, and showed that such problems are easily reduced to the usual two-state network reliability problem for which common techniques such as the factoring theorem are readily applicable.

TL;DR: This paper gives the usually used Jelinski and Moranda model for software failures a new interpretation and some other specific models which may be more realistic are also derived.

TL;DR: In this article, the authors developed a mathematical model for bathtub shaped hazards (failure rates) for operating systems with uncensored data, which was used to predict the reliability of systems with such hazards.

TL;DR: In this article, a plausible stochastic process is proposed to describe the sequence of failures and the expected number of failures, and an optimum policy is discussed to minimize the total expected cost per unit time.

TL;DR: The overall reliability of a computer network in which hierarchical routing strategies are used for the communication between its nodes is determined by an exact method followed by three fast computer techniques corresponding to three different routing policies.

TL;DR: In this article, the authors present several aspects of robot reliability and safety, and an extensive list of selective references is presented, as well as a survey of the literature on robot reliability.

TL;DR: In this article, the spectral coefficients of a switching function are computed in terms of the real transform of the function, or equivalently, in terms a disjoint sum-of-products representation of a function.

TL;DR: The real transform of an n-variable switching function is a multiaffine function of the same truth table as the switching function and has a finite multivariable Taylor's expansion which is completely specified by 2 n coefficients as discussed by the authors.

TL;DR: Device for the testing and checking of the operation of blocks within an integrated circuit, characterized in that it is formed from a set of shift registers and logic circuits associated with each block of the circuit to be tested.

TL;DR: In this paper, the authors present a brief introduction and selective up-to-date references related to automotive reliability, and present a review of the most relevant references to reliability in automotive applications.

TL;DR: In this paper, an improved version of the model formulation, by bringing in additionally the maintenance and per unit repair time costs, is considered, and a procedure to obtain the optimal number of components in the system with the condition that the system is allowed to undergo a prefixed maximum number of repairs, after which the system was to be replaced.

TL;DR: In this paper, an increase of positive gate oxide charge and interface trap densities has been shown to be responsible for positive gate bias stress induced instabilities of threshold voltage and gain factor in Al-gate and Si-gate transistors.

TL;DR: In this paper, a wide, direct bandgap, II-VI compound semiconductor has been used as a gamma-ray detector for the first time, with a resistivity of 4.9 × 10 −2 ohm-cm 2.

TL;DR: In this paper, the authors introduced a better mean residual life at t 0 (BMRL-t 0 ) class of life distributions, where the MRL decreases initially during [0, t 0 ] and then for t ≥ t 0, for t ≤ t ≤ 0, t ≤ 1, the residual life of an item at time t ≤ 2 is not greater than that of the item at age t ≤ 3.

TL;DR: In this paper, the authors used simulation techniques to repeatedly generate stress and strength of a system by the computer, using a random number generator and methods such as the inverse transformation technique.

TL;DR: In this article, the availability and reliability analysis of a two-unit system with a warm standby having a single service facility for the performance of preventive maintenance and repair is carried out, where failure times, repair times, inspection times and preventive maintenance times of the main unit and of the standby one are assumed to be arbitrarily distributed.