Showing papers in "Microelectronics Reliability in 1992"

TL;DR: In this article, the scale parameter in a generalized life distribution is considered under entropy loss, linex loss and squared error loss respectively, and the risks and Bayes risks for those estimators as well as for maximum likelihood estimator (MLE), median unbiased estimator(MUE) are calculated and simultaneously compared for a number of priors.

TL;DR: The classification concepts in use in the continuous setup are modified to define discrete IFR, DFR, IFRA and DFRA classes, and their properties are examined and sharp reliability bounds are provided.

TL;DR: In this article, a new model of a lifetime distribution having bathtub shaped failure rate is presented, which has two parameters, finite origin and finite failure rate, and is easy tractable for applications in reliability engineering.

TL;DR: In this article, a brief introduction and an extensive list of selective references on failure modes and effects analysis concept is presented, along with a detailed discussion of failure modes, effects analysis and failure modes.

TL;DR: In this paper, the optimal gate bias which ensures the drain current to be temperature independent is derived for both linear and saturation regions of MOS transistor operation, and the expression for the linear region successfully accounts for the effect of dependence of the zero temperature coefficient (ZTC) point on the drain bias.

TL;DR: In this article, reliability and availability analysis of warm standby systems with common-cause failures and human errors is presented, showing the effect of human errors on system reliability, availability, and mean time to failure.

TL;DR: Two newly developed Markov models representing two identical unit standby systems with common-cause failures and human errors are presented, and the system reliability, mean time to failure, variance of time to fail, and time-dependent system availability expressions are developed.

TL;DR: In this paper, the authors propose a method for establishing an exact confidence interval for availability under the assumption that the time between failures and the time to repair are independent Weibull and lognormal random variables, respectively.

TL;DR: Modeling a maximum concurrency scheduling in concurrent systems by Petri nets, and making use of the results for predicting the amount of effort required in modeling and analysis is made.

TL;DR: In this paper, an analytical explicit solution of the moments of a system of an overflow queue with balking, reneging and an additional server for longer queues is given. And the authors deduce some particular cases for the two systems.

TL;DR: In this article, two preventive maintenance (PM) policies for the bus engines of a transport network have been considered, where the failure rate of the engines does not exceed the pre-determined level of maximum failure rate.

TL;DR: In this article, the optimization problems for the minimum expected total cost of k-out-of-n systems are formulated and solved for the optimization problem of parallel, series, N-Modular Redundancy (NMR), and fail safe systems.

TL;DR: In this paper, the optimal replacement time for a system with imperfect preventive maintenance operations under the modified warranty policy is determined, where the hazard rate after preventive maintenance lies between the states as good as new and as bad as old.

TL;DR: In this article, the M/M/R machine repair problem consisting of M operating machines with S spares, and R repairmen in the repair facility under steady-state conditions was studied.

TL;DR: In this paper, the cost-benifit analysis of a two-unit priority standby system subject to random shocks is presented, where the priority unit gets preference both for repair and operation over the ordinary unit and has three modes- Normal, quasi-normal and total failure.

TL;DR: In this article, the authors show that such a form for the differential equation describing the rate of reaction that leads to failure is rather generally valid for any elementary reaction leading to failure, provided that the reaction rate is independent of any explicit time dependence.

TL;DR: In this paper, the concept of fuzzy probability has been used in the evaluation of reliability of a general non-series parallel network, where only two operations, i.e., multiplication and complementation, need to be performed in assessing system reliability.

TL;DR: In this article, the authors consider a k-out-of-n system and find the optimal T which minimizes the long run expected cost per unit time of the policy.

TL;DR: In this article, a two-server, two-unit redundant system with one unit being operative and the other being a warm standby was analyzed to determine the reliability measures by using semi-Markov processes and regenerative processes.

TL;DR: In this paper, a reparable system working in a fluctuating environment is considered and the mathematically formulated problem is solved using the direct integration method for solving partial differential equations.

TL;DR: In this paper, a costbenefit analysis of a single-unit system with three possible modes of the unit (normal, partial failure and complete failure) is carried out, and a comparison between these two models after calculating MTSF and profit has also been made.

TL;DR: In this article, the authors discuss unified performance and reliability analysis of a system which operates in a critical environment, in the sense that a catastrophic condition is reached when the accumulated down time exceeds a given threshold.

TL;DR: F fuzzy Markov modelling for a power generator with a derated state has been developed and it is seen that this model serves better than the previous one by considering the expert's subjective opinions about the state transition probabilities.

TL;DR: In this paper, a correlation between failures caused by electromagnetic interference (EMI) and the step response of all-bipolar and FET-input operational amplifiers is discussed, and guidelines for the design of low EMI-susceptibility integrated-circuit opamps are presented.

TL;DR: In this paper, a fault model for gate oxide shorts is presented and used to analyze the conditions under which a typical CMOS inverter becomes functionally faulty, and a static current inspection testing technique is considered for this kind of fault.

TL;DR: In this paper, a recursive formula for the reliability of a dynamic warm standby redundant system of n components with imperfect switching and constant failure rates is obtained using success modes analysis and is verfied for some known special cases.

TL;DR: An algorithm to enumerate terminal and multiterminal pathsets of directed as well as nondirected reliability logic diagrams (RLD) and more than 95% of the unnecessary multiplications have been avoided.

TL;DR: In this article, the authors summarized basic definitions and concepts of software reliability and discussed software reliability measurement and assessment based on software reliability growth models described by nonhomogeneous Poisson processes.

TL;DR: In this paper, a least square method was applied to estimate parameters of a Weibull distribution, with the shape parameter lying in the range 0-3, where other methods like the maximum likelihood method are generally not applicable.