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A 600V GaN-on-Si Power IC with Integrated Gate Driver, Freewheeling Diode, Temperature and Current Sensors and Auxiliary Devices

TLDR
In this paper, a lateral GaN-on-Si power IC is presented, which realizes the core functionality for power converters on-chip, and demonstrates significant functionality enhancement of large-area GaN power transistors by monolithic integration of additional circuitry.
Abstract
A lateral GaN-on-Si power IC is presented, which realizes the core functionality for power converters on-chip. Monolithic integration enhances the functionality of a 600 V, 85mW power transistor by an intrinsic freewheeling diode, gate-driver, current shunt and an isolated temperature sensor. An integrated auxiliary transistor and a diode realize a single-input pre-driver, a current-mirror sensor or a voltage clamp for on-resistance measurement. Gate driver losses were measured up to 70 MHz. A 350V hard-switching half-bridge shows 98.8% efficiency at 600W and 65 kHz. Continuous 40MHz resonant-switching at 200V and 6A triangular peak current was achieved, operating the half-bridge at 50% duty-cycle with a 75 nH air-core inductor. The work demonstrates significant functionality enhancement of large-area GaN power transistors by monolithic integration of additional circuitry at low additional cost and chip area.

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Citations
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Journal ArticleDOI

PCB-Embedded GaN-on-Si Half-Bridge and Driver ICs With On-Package Gate and DC-Link Capacitors

TL;DR: In this paper, a low-inductive half-bridge and gate driver package with on-package gate and dc-link capacitors is realized by printed circuit board (PCB) embedding of two GaN-on-Si ICs.
Proceedings ArticleDOI

A 600V p-GaN Gate HEMT with Intrinsic Freewheeling Schottky-Diode in a GaN Power IC with Bootstrapped Driver and Sensors

TL;DR: In this article, a normally-off 600V GaN Power IC is presented, which combines a large-area power transistor with intrinsic freewheeling diode, a gate driver, and temperature and current sensors on-chip.
Journal ArticleDOI

GaN power IC design using the MIT virtual source GaNFET compact model with gate leakage and V T instability effect

TL;DR: In this paper, the authors presented the MIT virtual source GaNFET model for GaN integrated circuit (IC) design, which was adapted to model the threshold voltage (V T) instability and p-GaN gate leakage.

Junction Temperature Measurement for Paralleled Silicon-Carbide MOSFETs in Conduction Mode

TL;DR: In this article , a solution for junction temperature sensing of parallel SiC-MOSFETs in all operation modes is proposed, which utilizes the temperature dependency of the MOSFets internal gate resistance to sense the junction temerature.

Coil Design for Integration with GaN Hall-Effect Sensors

TL;DR: In this paper , a detailed geometry optimization study for a coil routed around a GaN Hall-effect magnetic sensor is presented for current monitoring applications, and an electromagnetic 3-dimensional model examines the dimensions and configurations of the coil in a single or multiple turns for integration with a senseHEMT.
References
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Journal ArticleDOI

PCB-Embedded GaN-on-Si Half-Bridge and Driver ICs With On-Package Gate and DC-Link Capacitors

TL;DR: In this paper, a low-inductive half-bridge and gate driver package with on-package gate and dc-link capacitors is realized by printed circuit board (PCB) embedding of two GaN-on-Si ICs.
Proceedings ArticleDOI

A 600V p-GaN Gate HEMT with Intrinsic Freewheeling Schottky-Diode in a GaN Power IC with Bootstrapped Driver and Sensors

TL;DR: In this article, a normally-off 600V GaN Power IC is presented, which combines a large-area power transistor with intrinsic freewheeling diode, a gate driver, and temperature and current sensors on-chip.
Journal ArticleDOI

GaN power IC design using the MIT virtual source GaNFET compact model with gate leakage and V T instability effect

TL;DR: In this paper, the authors presented the MIT virtual source GaNFET model for GaN integrated circuit (IC) design, which was adapted to model the threshold voltage (V T) instability and p-GaN gate leakage.
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