A comprehensive facility for EXAFS measurements at the INDUS-2 synchrotron source at RRCAT, Indore, India

TLDR: The EXAFS technique, which deals with fine structure oscillations observed in the X-ray absorption spectrum of an element from 50 eV to ~700 eV above its absorption edge, gives precise information regarding the short range order and local structure around the particular atomic species in the material as discussed by the authors.

Abstract: The EXAFS technique, which deals with fine structure oscillations observed in the X-ray absorption spectrum of an element from 50 eV to ~700 eV above its absorption edge, gives precise information regarding the short range order and local structure around the particular atomic species in the material. With the advent of modern bright synchrotron radiation sources, EXAFS has emerged to be the most powerful local structure determination technique, which can be applied to any type of material viz. amorphous, polycrystalline, polymers, surfaces and solutions etc. Over the last few years a comprehensive facility for carrying out EXAFS measurements with synchrotron radiation over variety of samples has been developed at the 2.5 GeV, Synchrotron Radiation Source (INDUS-2) at RRCAT, Indore, India. The facility consists of two operational beamlines viz., the energy dispersive EXAFS beamline (BL-08) and the Energy Scanning EXAFS beamline (BL-09).