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Journal ArticleDOI

A method for measuring two-dimensional refractive index distribution with the total internal reflection of p-polarized light and the phase-shifting interferometry

TLDR
Based on the total internal reflection of p-polarized light and the phase-shifting interferometry, an alternative method for measuring the two-dimensional refractive index distribution of a material is presented in this article.
About
This article is published in Optics Communications.The article was published on 2006-12-01. It has received 15 citations till now. The article focuses on the topics: Total external reflection & Total internal reflection.

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Citations
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Journal ArticleDOI

Dynamical measurement of refractive index distribution using digital holographic interferometry based on total internal reflection

TL;DR: A method for dynamically measuring the refractive index distribution in a large range based on the combination of digital holographic interferometry and total internal reflection is presented.
Journal ArticleDOI

Near-Membrane Refractometry Using Supercritical Angle Fluorescence.

TL;DR: A combination of TIRF excitation and supercritical angle fluorescence emission detection is used to directly measure the average RI in the "footprint" region of the cell during image acquisition, and this technique has important applications for imaging axial vesicle dynamics and the mitochondrial energy state or detecting metabolically more active cancer cells.
Journal ArticleDOI

Full-field refractive index measurement with simultaneous phase-shift interferometry

TL;DR: In this paper, a technique of simul- taneous phase-shift interferometry is proposed for measuring the full-field refractive index using the phenomenon of total internal reflection and a beam splitting device.
Journal ArticleDOI

Probing Micro-Newton Forces on Solid/Liquid/Gas Interfaces Using Transmission Phase Shift.

TL;DR: This work provides the first direct evidence that in the issues of floating versus sinking at small-scale, Archimedes' principle should be generalized to include the crucial role of surface tension and reveal the dominant regimes of floating particles based on the Bond number.
Journal ArticleDOI

Dynamic full-field refractive index distribution measurements using total internal reflection terahertz digital holography

- 07 Jan 2022 - 
TL;DR: In this paper , an attenuated total reflection prism with a pitching angle was used to measure the full-field dynamical terahertz refractive index (THz) distribution for both solid and liquid samples.
References
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Book

Fundamentals of Photonics

TL;DR: The Fundamentals of Photonics, Third Edition as discussed by the authors is a self-contained and up-to-date introductory-level textbook that thoroughly surveys this rapidly expanding area of engineering and applied physics.
Journal ArticleDOI

Optical coherence tomography - principles and applications

TL;DR: OCT as discussed by the authors synthesises cross-sectional images from a series of laterally adjacent depth-scans, which can be used to assess tissue and cell function and morphology in situ.
Journal Article

Polarized light. Fundamentals and applications

Edward Collett
- 01 Jan 1993 - 
TL;DR: In this article, the Stokes parameters and the Mueller matrices for optical and Fararaday rotation were used to measure the characteristics of polarizing elements and to calculate the parameters of the polarization ellipse.
Book ChapterDOI

Investigation and compensation of the nonlinearity of heterodyne interferometers

TL;DR: In this paper, the phase difference between the two orthogonal directions in the output beam is measured separately and compared with the reference signal, and when the arithmetical mean value is formed, except for a small residual error, the phase value obtained is free from nonlinearities.
Journal ArticleDOI

Analytical modeling of the periodic nonlinearity in heterodyne interferometry.

TL;DR: An analytical approach to investigating the periodic nonlinearity that arises from nonideal laser sources and imperfections of optical components limits the accuracy of displacement measurements in heterodyne interferometry at the nanometer level.
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