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Open AccessJournal ArticleDOI

A robust phase extraction method for overcoming spectrum overlapping in shearography

Xiangwei Liu, +2 more
- 01 Jan 2023 - 
- Vol. 4, Iss: 1, pp 1-1
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This article is published in Light: advanced manufacturing.The article was published on 2023-01-01 and is currently open access. It has received 0 citations till now. The article focuses on the topics: Shearography & Extraction (chemistry).

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Journal ArticleDOI

Image quality assessment: from error visibility to structural similarity

TL;DR: In this article, a structural similarity index is proposed for image quality assessment based on the degradation of structural information, which can be applied to both subjective ratings and objective methods on a database of images compressed with JPEG and JPEG2000.
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Two-dimensional windowed Fourier transform for fringe pattern analysis: Principles, applications and implementations

TL;DR: Two algorithms, one based on filtering and the other based on similarity measure, are developed and some applications based on these two algorithms are explored, including strain determination, phase unwrapping, phase-shifter calibration, fault detection, edge detection and fringe segmentation.
Journal ArticleDOI

Phase-shifting algorithms for nonlinear and spatially nonuniform phase shifts

TL;DR: In this article, an errorexpansion method was proposed to construct phase-shifting algorithms that can compensate for nonlinear and spatially nonuniform phase shifts, and three new algorithms (six-sample, eight-sample and nine-sample) were presented.
Journal ArticleDOI

One-step robust deep learning phase unwrapping.

TL;DR: With a trained deep neural network, the unseen phase fields of living mouse osteoblasts and dynamic candle flame are successfully unwrapped, demonstrating that the complicated nonlinear phase unwrapping task can be directly fulfilled in one step by a singledeep neural network.
Journal ArticleDOI

Measurement of transparent plates with wavelength-tuned phase-shifting interferometry

TL;DR: In this paper, a wavelength-tuned Fizeau interferometer is applied to the problem of flatness testing of transparent plates and the resulting front surface profile exhibits less than 2 nm of residual error attributable to spurious reflections from within the plate.
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