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Open AccessProceedings Article

A Statistical Calculation of Fault Detection Probabilities By Fast Fault Simulation.

John A. Waicukauski, +4 more
- pp 779-784
About: 
This article is published in International Test Conference.The article was published on 1985-01-01 and is currently open access. It has received 42 citations till now. The article focuses on the topics: Fault coverage & Fault detection and isolation.

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Journal ArticleDOI

A method for generating weighted random test pattern

John A. Waicukauski, +3 more
- 01 Mar 1989 - 
TL;DR: A new method for generating weighted random patterns for testing LSSD logic chips and modules and an algorithm for calculating an initial set of input-weighting factors and a procedure for obtaining complete stuck-fault coverage are presented.
Proceedings ArticleDOI

Constructive multi-phase test point insertion for scan-based BIST

N. Tamarapalli, +1 more
TL;DR: Experimental results demonstrate that complete or near-complete stuck-at fault coverage can be achieved by the proposed technique with the insertion of a few test points and a minimum number of phases.
Journal ArticleDOI

HSS--A High-Speed Simulator

Zeev Barzilai, +3 more
- 01 Jul 1987 - 
TL;DR: The paper discusses the merits and drawbacks of the HSS strategy, the extensions of HSS to model sequential logic and the various applications of H SS, which include functional verification, design for testability, good machine signatures, and accurate simulation of transistor-level defects in certain CMOS technologies.
Journal ArticleDOI

On computing the sizes of detected delay faults

Vijay S. Iyengar, +2 more
- 01 Mar 1990 - 
TL;DR: A model for delay faults that answers questions correctly, but with calculations simple enough to be done for large circuits, is presented.
Proceedings ArticleDOI

Fault Location with Current Monitoring

Robert Campbell Aitken
TL;DR: The proposed system combines a simple single fault model for test generation with a more realistic multiple defect model for diagnosis, and the associated hardware is sufficiently simple that on-board implementation is possible.