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Proceedings ArticleDOI

An accurate PLL behavioral model for fast Monte Carlo analysis under process variation

TLDR
An accurate behavioral Monte Carlo simulation (BMCS) approach to analyze PLL designs under process variation is developed by building a bottom-up behavioral modeling approach with an efficient extraction process to provide accurate enough results with less regression cost.
Abstract
Hierarchical statistical analysis using the regression-based approach is often used to improve the extremely expensive HSPICE Monte Carlo (MC) analysis. However, accurately fitting the regression equations requires many simulation samples. In this paper, an accurate behavioral Monte Carlo simulation (BMCS) approach to analyze PLL designs under process variation is developed by building a bottom-up behavioral modeling approach with an efficient extraction process. Using the accurate model, we also develop a modified sensitivity analysis for process variation effects to provide accurate enough results with less regression cost. As shown in the experimental results, we reduce the simulation time of HSPICE MC analysis from several weeks to several hours and still retain similar statistical results as in HSPICE MC simulation.

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Citations
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Proceedings ArticleDOI

A Phase-Locked Loop reference spur modelling using Simulink

TL;DR: Charge pump and Phase/Frequency Detector non-idealities are introduced in the integer-N PLL behavioural model to estimate the periodic noise, which is also known as reference spurs.
Proceedings ArticleDOI

PLL lock time prediction and parametric testing by lock waveform characterization

TL;DR: This method uses either an Automatic Test Equipment or on-chip Digital Signal Processor to compute FFT values for the lock waveform which is then used for lock time prediction and includes parametric fault coverage in addition to catastrophic fault coverage without any significant test time overhead.
Proceedings ArticleDOI

A new all-digital phase-locked loop based on single CPLD

TL;DR: A new all-digital phase-locked loop (ADPLL) is presented, which locks phase faster and the frequency range of the input signal is wider.
References
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Proceedings ArticleDOI

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TL;DR: In this article, the authors examine the sources and trends of process variability, the new challenges associated with the increase in within-die variability analysis, and propose a modeling and simulation methodology to deal with this variability.
Proceedings ArticleDOI

Hierarchical statistical characterization of mixed-signal circuits using behavioral modeling

TL;DR: A methodology for hierarchical statistical circuit characterization which does not rely upon circuit-level Monte Carlo simulation is presented and permits the statistical characterization of large analog and mixed-signal systems.
Proceedings ArticleDOI

Projection-based performance modeling for inter/intra-die variations

TL;DR: A novel projection-based extraction approach, PROBE, is proposed to efficiently create quadratic response surface models and capture both inter-die and intra-die variations with affordable computation cost.
Proceedings ArticleDOI

Lookup table based simulation and statistical modeling of Sigma-Delta ADCs

TL;DR: This approach can provide up to four orders of magnitude runtime speedup over SPICE-like simulators, hence significantly shortening the CPU time required for evaluating system performances such as SNDR (signal-noise-distortion-ratio).
Proceedings ArticleDOI

Statistical behavioral modeling of integrated circuits

TL;DR: A full statistical model for the behavioral parameter of an analog cell is presented and the accuracy of the results obtained utilizing the characterized behavioral MOSFET-C filter and the PLL models, relative to the circuit-level simulation is considered.