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Journal ArticleDOI

Focusing analysis of the pinhole photon sieve: individual far-field model

Qing Cao, +1 more
- 01 Dec 2002 - 
- Vol. 19, Iss: 12, pp 2387-2393
TLDR
This work presents a simple yet accurate analytical model for the focusing of the pinhole photon sieve, applicable to arbitrary paraxial illumination with arbitrary complex amplitude distribution at the photon sieving plane.
Abstract
Recently, a new class of diffractive optical element called a photon sieve, which consists of a great number of pinholes, was developed for the focusing and imaging of soft x rays. In terms of the closed-form formula for the far field of individual pinholes and the linear superposition principle, we present a simple yet accurate analytical model for the focusing of the pinhole photon sieve. This model is applicable to arbitrary paraxial illumination with arbitrary complex amplitude distribution at the photon sieve plane. We check the validity range of this model by comparing it with the exact Fresnel diffraction integral. Some special problems, such as the individual quasi-far-field correction for very large pinholes and the related phase shift induced by this correction, are also discussed.

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Citations
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Journal ArticleDOI

Large optical photon sieve

TL;DR: A photon sieve with 10(7) holes has been constructed for operation at optical wavelengths and is diffraction limited over a significant bandwidth and has a moderate field of view.
Journal ArticleDOI

Broadband antihole photon sieve telescope

TL;DR: The diffraction-limited performance of a 1 m focal-length, f/10 element is demonstrated with a view toward constructing large lightweight telescopes for space applications.
Journal ArticleDOI

Photon-sieve lithography

TL;DR: This work fabricated the highest-numerical-aperture photon sieves reported to date and experimentally verified their focusing characteristics and proposes two new designs of the photon sieve that have the potential to significantly increase focusing efficiency.
Journal ArticleDOI

Holey-Metal Lenses: Sieving Single Modes with Proper Phases

TL;DR: The experimental results confirm that the focusing properties of the polarization-independent, holey-metal lens milled in a 380-nm-thick gold film and illuminated with 531 nm light fits the analytical model well and could offer an alternative to conventional refraction microlenses.
Journal ArticleDOI

Fractal photon sieve

TL;DR: It is shown that compared with a conventional photon sieving, the fractal photon sieve exhibits an extended depth of field and a reduced chromatic aberration.
References
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Journal ArticleDOI

Sharper images by focusing soft X-rays with photon sieves

TL;DR: It is shown that a large number of pinholes distributed appropriately over the Fresnel zones make it possible to focus soft X-rays to spot sizes smaller than the diameter of the smallest pinhole.
Book ChapterDOI

Zone Plates for X-Ray Microscopy

TL;DR: In this article, a zone plate is defined as a circular gratings with radially increasing line density and its focal length is given by fm = r1 2 λ−1 m−1.
Journal ArticleDOI

Electron beam lithography digital pattern generator and electronics for generalized curvilinear structures

TL;DR: A vector scan pattern generator, optimized for smooth curvilinear as well as rectilinear primitive shapes, has been designed and constructed and initial lithography results confirm the operation of the system and stepping rates of 40 MHz have been achieved.
Journal ArticleDOI

Distinguishing between Fraunhofer and Fresnel diffraction by the Young's experiment

TL;DR: In this article, it is shown that the optical path difference introduced by this setup fits the Fresnel's phase difference between the pinholes, and a criterion for distinguishing between Fresnel and Fraunhofer diffraction based on this number of Fresnel zones is proposed, which is applicable for diffracting apertures with any shape.
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