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Patent

High speed latch and flip-flop

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TLDR
In this paper, a latch and flip-flop are disclosed that have a reduced clock-to-q delay and/or a reduced setup time, where the data input signal is passed directly to a data output terminal, and the complement data input signals are passed direct to a complement data output signal.
Abstract
A latch and flip-flop are disclosed that have a reduced clock-to-q delay and/or a reduced setup time. This is preferably accomplished by providing both a data input signal and a complement data input signal to the latch or flip-flop. The data input signal and the complement data input signal are selectively connected to opposite sides of a pair of cross-coupled gates (409, 410) via a switch or the like. The switch is preferably controlled by an enable signal, such as a clock. With the switch elements enabled, the data input signal is passed directly to a data output terminal, and the complement data input signal is passed directly to a complement data output signal. Because the data input signal is passed directly to a data output terminal, and the complement data input signal is passed directly to a complement data output signal, the clock-to-q time may be reduced. In addition, because the data input signal and the complement data input signal drive opposite sides of the cross-coupled pair of gates, the state of the cross-coupled pair of gates can be more quickly set to a desired state. This helps reduce the clock-to-q time, as well as the setup time.

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Citations
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References
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Journal ArticleDOI

Comparative analysis of master-slave latches and flip-flops for high-performance and low-power systems

TL;DR: A new simulation and optimization approach is presented, targeting both high-performance and power budget issues, and the analysis approach reveals the sources of performance and power-consumption bottlenecks in different design styles.
Proceedings ArticleDOI

A 200 mV self-testing encoder/decoder using Stanford ultra-low-power CMOS

J.B. Burr, +1 more
TL;DR: A CMOS test chip that includes a 1k-transistor self-testing encoder/decoder is verifiably error-free at supply voltages down to 20O mV, achieving 1/625 the power-delay product of standard 5 V CMOS.
Patent

CMOS scannable latch

John J. Zasio, +1 more
TL;DR: The scannable latch circuit as discussed by the authors allows the output of the latch circuit to be monitored during effectively 100% of the system clock cycle, which is useful for error detection and other purposes without having to slow down the operating speed.
Journal ArticleDOI

Metastability of CMOS latch/flip-flop

TL;DR: In this article, the authors used the AC small-signal analysis in the frequency domain instead of the usual time-domain approach to obtain the optimal device size, aspect ratio, and configurations for the design of the metastable hardened CMOS latch/flip-flops.
Patent

Flip-flop circuit

TL;DR: In this article, a flip-flop circuit receives a pair of complementary data signals, then outputs complementary signals corresponding to the pair of data signals to a driving gate means which outputs a signal corresponding to at least one data signal.