Journal ArticleDOI
Modeling, calibration, and correction of nonlinear illumination-dependent fixed pattern noise in logarithmic CMOS image sensors
Dileepan Joseph,Steve Collins +1 more
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TLDR
A nonlinear model y=a+bln(c+x)+/spl epsi/ of a pixel for the digital response y to an illuminance x is developed and shows that the FPN arises from a variation of the offset a, gain b, and bias c from pixel to pixel.Abstract:
At present, most CMOS image sensors use an array of pixels with a linear response. However, pixels with a logarithmic response are also possible and are capable of imaging high dynamic range scenes without saturating. Unfortunately, logarithmic image sensors suffer from fixed pattern noise (FPN). Work reported in the literature generally assumes the FPN is independent of illumination. This paper develops a nonlinear model y=a+bln(c+x)+/spl epsi/ of a pixel for the digital response y to an illuminance x and shows that the FPN arises from a variation of the offset a, gain b, and bias c from pixel to pixel. Equations are derived to estimate these parameters by calibrating images of uniform stimuli, taken with varying illuminances. Experiments with a Fuga 15d image sensor, demonstrating parameter calibration and FPN correction, show that the nonlinear model outperforms previous models that assume either only offset or offset and gain variation.read more
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Journal ArticleDOI
Wide-Dynamic-Range CMOS Image Sensors—Comparative Performance Analysis
TL;DR: In this article, the authors proposed a set of criteria upon which an effective comparative analysis of the performance of wide-DR (WDR) sensors can be done, based upon the quantitative assessments of the following parameters: signal-to-noise ratio, DR extension, noise floor, minimal transistor count, and sensitivity.
Journal ArticleDOI
Extended Dynamic Range From a Combined Linear-Logarithmic CMOS Image Sensor
TL;DR: A CMOS image sensor that can operate in both linear and logarithmic mode is described, and a novel on-chip method of deriving a reference point has been implemented that addresses the problems of high fixed pattern noise, slow response time, and low signal-to-noise ratio (SNR) in logarithsmic mode.
Proceedings ArticleDOI
A new high speed cmos camera for real-time tracking applications
TL;DR: The main idea of this paper is to combine existing standard technology (CMOS imaging sensors, FPGA "glue logic", and USB 2.0 interface) to use direct pixel access capabilities for real-time tracking to design and build a prototype camera system.
Journal ArticleDOI
Evaluation of sCMOS cameras for detection and localization of single Cy5 molecules
TL;DR: This study has compared the two technologies using two EMCCD and three sCMOS cameras to detect single Cy5 molecules and indicates that the s CMOS cameras perform similar to EM CCD cameras for detecting and localizing singleCy5 molecules.
Journal ArticleDOI
An Electronic-Calibration Scheme for Logarithmic CMOS Pixels
TL;DR: Using a three parameter model for the response of logarithmic pixels, it is concluded that the residual fixed pattern noise in these images is caused by gain variations between pixels and a new type of readout circuit has been designed.
References
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Book
Neural networks for pattern recognition
TL;DR: This is the first comprehensive treatment of feed-forward neural networks from the perspective of statistical pattern recognition, and is designed as a text, with over 100 exercises, to benefit anyone involved in the fields of neural computation and pattern recognition.
Book ChapterDOI
Neural Networks for Pattern Recognition
Suresh Kothari,Heekuck Oh +1 more
TL;DR: The chapter discusses two important directions of research to improve learning algorithms: the dynamic node generation, which is used by the cascade correlation algorithm; and designing learning algorithms where the choice of parameters is not an issue.
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Probability and Statistics for Engineers and Scientists
TL;DR: In this paper, the authors present a survey of statistical and data analysis methods for probability distributions and their application to statistical quality control problems, including one and two Sided Tests of Hypotheses.
Book
Probability and statistics for engineers
TL;DR: Within the presentation of topics and applications the authors continually develop students' intuition for collecting their own real data, analyzing it with the latest graphical tools, and interpreting the results with a goal of improving quality control and problem-solving process.