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On the problem of the consistency of the high-temperature precipitation model with the classical nucleation theory

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TLDR
In this article, the adequacy of the model of high-temperature precipitation in dislocation-free silicon single crystals to the classical theory of nucleation and growth of second-phase particles in solids has been considered.
Abstract
The adequacy of the model of high-temperature precipitation in dislocation-free silicon single crystals to the classical theory of nucleation and growth of second-phase particles in solids has been considered. It has been shown that the introduction and consideration of thermal conditions of crystal growth in the initial equations of the classical nucleation theory make it possible to explain the precipitation processes occurring in the high-temperature range and thus extend the theoretical basis of the application of the classical nucleation theory. According to the model of high-temperature precipitation, the smallest critical radius of oxygen and carbon precipitates is observed in the vicinity of the crystallization front. Cooling of the crystal is accompanied by the growth and coalescence of precipitates. During heat treatments, the nucleation of precipitates starts at low temperatures, whereas the growth and coalescence of precipitates occur with an increase in the temperature. It has been assumed that the high-temperature precipitation of impurities can determine the overall kinetics of defect formation in other dislocation-free single crystals of semiconductors and metals.

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Citations
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Journal ArticleDOI

Fabrication and characterization of nickel thin film as resistance temperature detector

TL;DR: In this article, the fabrication of Ni RTDs at low temperatures is investigated by direct-current (DC) magnetron sputtering, and the effects of sputter pressure and power on thin film microscopic morphology and structure are also investigated.
Journal ArticleDOI

Diffusion model of the formation of growth microdefects: A new approach to defect formation in crystals (Review)

TL;DR: In this paper, a comparative analysis of modern theoretical approaches to the description of interaction of point defects and formation of the initial defect structure of dislocation-free silicon single crystals has been carried out.
Journal ArticleDOI

Complex formation in semiconductor silicon within the framework of the Vlasov model of a solid state

TL;DR: In this paper, the formation of silicon carbon and siliconoxygen complexes during cooling after the growth of dislocation-free silicon single crystals has been calculated using the Vlasov model of crystal formation.

A Selective Review of the Quantification of Defect Dynamics in Growing Czochralski Silicon Crystals

TL;DR: In this paper, the authors present a detailed review of the defect dynamics in the Czochralski process and the float-zone process in growing CZ and FZ crystals.
References
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Journal ArticleDOI

A selective review of the quantification of defect dynamics in growing Czochralski silicon crystals

TL;DR: In this article, the authors present a detailed review of the defect dynamics in the Czochralski process and the float-zone process in growing CZ and FZ crystals.
Journal ArticleDOI

Octahedral void defects in Czochralski silicon

TL;DR: In this paper, the authors characterized the occurrence of (0 − 0 − 1) sub-planes in void defects and showed that void defects are closely related to some physical phenomenon in Si melt growth.
Book ChapterDOI

Fundamentals and Engineering of the Czochralski Growth of Semiconductor Silicon Crystals

TL;DR: In this paper, the Czochralski silicon crystal growth from nanoscale to macro-scale is discussed, and the basic phenomena of crystal growth involving the geometric stability of the growing crystal, interfacial kinetics, facet formation, and impurity segregation are discussed.
Journal ArticleDOI

Kinetic model of growth and coalescence of oxygen and carbon precipitates during cooling of As-grown silicon crystals

TL;DR: In this article, a kinetic model of growth and coalescence of oxygen and carbon precipitates has been proposed to represent a unified model of precipitation in as-grown dislocation free silicon single crystals during their cooling in the temperature range from 1683 to 300 K.
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