Journal ArticleDOI
Optically interferometric roughness measurements for spherical surfaces by processing two microscopic interferograms
TLDR
In this article, a method to carry out optical interferometric measurements for the surface roughness of spheres in a biomedical application to an artificial joint, using two beams of a Michelson inter-ferometric microscope with digital image processing and a computational system, is discussed.About:
This article is published in Measurement.The article was published on 2002-09-01. It has received 8 citations till now. The article focuses on the topics: Surface roughness & Reference surface.read more
Citations
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Journal ArticleDOI
An automatic evaluation method for the surface profile of a microlens array using an optical interferometric microscope
TL;DR: In this article, an automatic evaluation method for the surface profile of a microlens array using an optical interferometric microscope is presented, where an XY-table is used to position it.
Journal ArticleDOI
3D surface profile measurement of unsymmetrical microstructure using Fizeau interferometric microscope
TL;DR: In this article, an automatic optical inspection system for the 3D surface profile of an unsymmetrical microstructure using Fizeau interferometer was proposed This non-contact inspection system is suitable for measuring the lens sag and 3D surfaces profile of symmetrical and un symmetrical microlenses, and fitting these discrete points as close curves through the Bezier curve theory.
Journal ArticleDOI
A novel chromatic confocal one-shot 3D measurement system based on DMD
TL;DR: In this paper, a one-shot chromatic confocal measurement system based on DMD (Digital Micromirror Device) is presented, which is set up by applying a polychromatic light source, a color camera, a dispersive lens and DMD.
Journal ArticleDOI
An automatic optical inspection system for measuring a microlens array with an optical interferometric microscope and genetic algorithm
TL;DR: An automatic optical inspection system for measuring the surface profile of a microlens array with a precision of less than 0.09 micron is proposed and the XY‐Table shortest moving path of the system is calculated to achieve the purpose of high‐speed inspection and automatic microlense array surface profile measurement.
Journal ArticleDOI
Precise perimeter measurement for planar object
Peng Zhao,Peng Zhao,Zhaobang Pu +2 more
TL;DR: In this paper, a novel measurement scheme for an object's surface boundary perimeter is proposed, which consists of four steps: first, a photoelectric image measurement system is devised to obtain a target image of a detected object, then a multi-scale active contour is applied in the defocusing and focusing image sequence to converge to the target's contour edge.
References
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Journal ArticleDOI
Sinusoidal phase modulating interferometry for surface profile measurement
Osami Sasaki,Hirokazu Okazaki +1 more
TL;DR: Interferometre a modulation de phase sinusoidale dans lequel une onde de reference est facilement modulee en phase avec un miroir vibrant.
Journal ArticleDOI
Surface profile measurement with a scanning differential ac interferometer.
G. Makosch,B. Drollinger +1 more
TL;DR: This paper presents a new interferometric profile measurement technique based on using a rigid differential interferometer probing the test object which is moved by a stage that makes the profile measurement largely insensitive to flatness errors of the mechanical stage and enables extremely precise measurements.
Journal ArticleDOI
Phase locked laser diode interferometry for surface profile measurement
TL;DR: A new type phase locked interferometer which uses tunability of the wavelength of a laser diode and uses a CCD image sensor as a photodetector to scan electrically a measuring point along the surface of the object.
Journal ArticleDOI
Delta-n control in GRIN glass by additives in AgCl diffusion baths.
TL;DR: The uptake of silver from a molten silver chloride bath by an aluminosilicate glass is highly sensitive to the presence of sodium in the salt bath under both equilibrium and nonequilibrium conditions.
Journal ArticleDOI
Charge-Coupled Device Image Acquisition For Digital Phase Measurement Interferometry
TL;DR: The use of CCD arrays and techniques for digitizing and interfacing these arrays to microcomputers for phase calculation are discussed.
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