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Preliminary Modelling and Implementation of the 2D-control for a Nanopositioning Long Range Stage

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TLDR
In this paper, a two-dimensional nanopositioning platform (NanoPla) has been designed and manufactured to obtain effective positioning at nanometer scale with increased working ranges.
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This article is published in Procedia Engineering.The article was published on 2015-01-01 and is currently open access. It has received 4 citations till now. The article focuses on the topics: Control theory.

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Citations
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Journal ArticleDOI

Large range nanopositioning stage design: A three-layer and two-stage platform

TL;DR: In this article, a two-dimensional nanopositioning platform (NanoPla) is described, which is characterized by a three-layer architecture and two-stage motion strategy.
Journal ArticleDOI

One-Dimensional Control System for a Linear Motor of a Two-Dimensional Nanopositioning Stage Using Commercial Control Hardware.

TL;DR: A one-dimensional (1D) control strategy for positioning a Halbach linear motor has been developed, implemented, and experimentally validated and it was verified that the control system achieves the working requirements of the NanoPla.
Journal ArticleDOI

Implementation of the control strategy for a 2D nanopositioning long range stage

TL;DR: In this paper, a 2D-platform stage able to obtain an effective metrological positioning with nanometer resolution and long working range (50 x 50 mm 2 ) is developed at the University of Zaragoza.
Journal ArticleDOI

Positioning uncertainty of the control system for the planar motion of a nanopositioning platform

TL;DR: The developed control system is extended to the four motors of the nanopositioning platform to generate a 2D planar movement in the whole working range of the NanoPla, achieving a positioning uncertainty of ±0.5 µm along the wholeWorking range.
References
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A three-layer and two-stage platform for positioning with nanometer resolution and submicrometer accuracy

TL;DR: In this article, a two-dimensional moving nano-platform (NanoPla) is designed to characterize surface topography of larger areas with an integrated atomic force microscopy (AFM) system.
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