Journal ArticleDOI
Quantitative depth profiling in surface analysis: A review
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This article is published in Surface and Interface Analysis.The article was published on 1980-08-01. It has received 264 citations till now.read more
Citations
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Journal ArticleDOI
Photoemission studies of adsorbed oxygen and oxide layers
TL;DR: A comprehensive review about the versatility of photoelectron spectroscopy to study the especially complex interaction of oxygen with metal surfaces and the nature of the reaction products can be found in this paper.
Journal ArticleDOI
Quantitative analysis of the inelastic background in surface electron spectroscopy
TL;DR: In this paper, a physical model for the problem is formulated and based on this, basic deconvolution formulae are found and in particular a formula is derived which allows the extraction of direct quantitative cross-section information through a simple analysis of REELS spectra.
Journal ArticleDOI
The quantitative analysis of surfaces by XPS: A review
TL;DR: In this article, a general framework is presented for the quantitative analysis of surfaces by X-ray photoelectron spectroscopy (XPS) or ESCA, which starts by considering analysis using reference data recorded on the same instrument and under identical conditions as the analysed sample.
Journal ArticleDOI
Thermodynamic and fractal geometric aspects of ion-solid interactions
TL;DR: In this article, a fractal geometry approach to spike formation is presented, based on an idealized collision cascade constructed from the inverse power potential V(r) √ r−1/m (0).
Journal ArticleDOI
Improved depth resolution by sample rotation during Auger electron spectroscopy depth profiling
TL;DR: In this article, a sample holder was equipped with a special mechanism which enables sample rotation during depth analysis, which significantly improves the depth resolution of AES composition-depth profiles, but the results of these first investigations clearly show that sample rotation was not sufficient to obtain real depth profiles.
References
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Journal ArticleDOI
Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solids
Martin P. Seah,W. A. Dench +1 more
TL;DR: In this paper, a compilation of all published measurements of electron inelastic mean free path lengths in solids for energies in the range 0-10 000 eV above the Fermi level is presented.
Journal ArticleDOI
Flattening of a Nearly Plane Solid Surface due to Capillarity
TL;DR: In this article, a general solution is obtained for the combined action of the transport processes of viscous flow, evaporation-condensation (in a closed system), volume diffusion, and surface diffusion.
Journal ArticleDOI
Quantitative Chemical Analysis by ESCA
TL;DR: In this paper, the electron mean free path for inelastic scattering as a function of energy for all elemental solids (with the exception of the rare earths and the actinides) and formulae for the calculation of the mean free paths for compounds were given.
Journal ArticleDOI
The depth resolution of sputter profiling
TL;DR: In this article, it is shown that the bulk radiation damage accompanying sputtering events sets ultimate limits to the depth resolution attainable in sputter profiling, and guidelines for selection of projectile species and energies to minimize such mixing are given and numerical estimates for attainable depth resolutions.
Journal ArticleDOI
Criteria for bombardment-induced structural changes in non-metallic solids
H. M. Naguib,Roger Kelly +1 more
TL;DR: In this article, both a temperature-ratio and a bond-type criterion are used to predict the occurrence of amorphization or crystallization in non-metallic solids induced by energetic heavy ions.
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Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solids
Martin P. Seah,W. A. Dench +1 more