Journal ArticleDOI
Reliability of IR-imaging of PV-plants under operating conditions
TLDR
In this paper, the reliability and usefulness of infrared-mapping of PV-plants were proved with the result that all modules having cells with increased temperature show remarkably reduced power output.About:
This article is published in Solar Energy Materials and Solar Cells.The article was published on 2012-12-01. It has received 143 citations till now. The article focuses on the topics: Reliability (semiconductor).read more
Citations
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Journal ArticleDOI
Faults and infrared thermographic diagnosis in operating c-Si photovoltaic modules: A review of research and future challenges
TL;DR: In this article, the authors present a comprehensive effort to review and highlight recent advances, ongoing research and future prospects, as reported in the literature, on the classification of faults in crystalline silicon (c-Si) PV modules and advanced diagnosis in the field, by means of the increasingly popular method of infrared thermal (IRT) imaging.
Journal ArticleDOI
Identifying PV Module Mismatch Faults by a Thermography-Based Temperature Distribution Analysis
TL;DR: In this article, the authors presented a low-cost and efficient temperature distribution analysis for identifying PV module mismatch faults by thermography, which can be incorporated into the maximum power point tracking schemes to shift the operating point of the PV string.
Journal ArticleDOI
Innovative Automated Control System for PV Fields Inspection and Remote Control
TL;DR: First results of this work have proven that the proposed procedure is very promising being fast, cost effective, and adaptable to large PV plants, which can be controlled during their entire lifetime.
Journal ArticleDOI
Analysis and evaluation of the impact of climatic conditions on the photovoltaic modules performance in the desert environment
Ahmed Bouraiou,Ahmed Bouraiou,Messaoud Hamouda,Abdelkader Chaker,Mohammed Mostefaoui,Salah Lachtar,Mohammed Sadok,Nadir Boutasseta,Mourad Othmani,Attoui Issam +9 more
TL;DR: In this paper, the impact of climate conditions on the performance of photovoltaic modules installed in the desert region in south of Algeria is investigated, and the performance degradation of the UDTS 50 modules such as discoloration of encapsulant and delamination are investigated.
Journal ArticleDOI
Recent advances in failure diagnosis techniques based on performance data analysis for grid-connected photovoltaic systems
TL;DR: In this article, the authors provide an overview of all the data analytic methods used by the research community and industry for the detection and classification of failures from acquired performance data of grid-connected PV systems.
References
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Journal ArticleDOI
The risk of power loss in crystalline silicon based photovoltaic modules due to micro-cracks
TL;DR: In this paper, an upper bound for the potential power loss of PV modules due to micro-cracks in the solar cells was derived by simulating the impact of inactive solar cell fragments on the power of a common PV module type and PV array.
Proceedings ArticleDOI
Hot spot investigations on PV modules-new concepts for a test standard and consequences for module design with respect to bypass diodes
TL;DR: The selection of the worst case cell should be improved by measurement of the module current at the characteristic break point of the I-V characteristic, and the hot-spot test procedure of IEC 1215 should be generalised for all types of cell interconnection circuits.
Proceedings ArticleDOI
Hot spot susceptibility and testing of PV modules
TL;DR: In this paper, the sensitivity of commercial amorphous silicon and crystalline modules to localized heating was evaluated under reverse bias conditions in the dark above a 5-20 mAcm/sup -2/cell current density at the interconnection between cells.
Journal ArticleDOI
Quality control of as-cut multicrystalline silicon wafers using photoluminescence imaging for solar cell production
Jonas Haunschild,Markus Glatthaar,Matthias Demant,Jan Nievendick,Markus Motzko,Stefan Rein,Eicke R. Weber +6 more
TL;DR: In this paper, the authors analyzed crystallization-related features in the images and identified defects of crystal growth (eg dislocations) and areas of reduced lifetime that form at the edges of the crystallization crucible or near the top or bottom of a brick.
Journal ArticleDOI
Strength of silicon wafers: fracture mechanics approach
P. Rupnowski,Bhushan Sopori +1 more
TL;DR: In this article, a generalized expression based on a multimodal Weibull distribution was proposed to describe the strength of a brittle material with surface, edge, and bulk flaws, and the specific case of a cast, unpolished photovoltaic (PV) wafer was further analyzed.