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Soft X-ray spectroscopy with sub-electron readnoise charge-coupled devices

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TLDR
In this article, the authors demonstrate use of a charge-coupled device with sub-electron readnoise performance as a non-dispersive X-ray spectrometer.
Abstract
We demonstrate use of a charge-coupled device (CCD) with sub-electron readnoise performance as a non-dispersive X-ray spectrometer. The exceptionally low readnoise (0.9 electrons rms) was achieved by applying a floating gate output amplifier with 16 readouts per pixel. The soft X-ray quantum efficiency was enhanced over other front-side illuminated devices by using a novel thin-poly gate structure. The combination of sub-electron noise and good soft X-ray quantum efficiency have enabled us to detect photons in the EUV energy range (E

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Citations
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Mean energy required to produce an electron-hole pair in silicon for photons of energies between 50 and 1500 eV

TL;DR: In this paper, the photon energy dependence of the mean energy required to produce an electron-hole pair in silicon for photons with energies between 50 and 1500 eV was determined from the spectral responsivity of selected silicon photodiodes.
Journal ArticleDOI

Determination of the electron–hole pair creation energy for semiconductors from the spectral responsivity of photodiodes

TL;DR: In this paper, the mean energy required for producing an electron-hole pair, W, is determined from the spectral responsivity of photodiodes using spectrally dispersed synchrotron radiation.
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Front-end electronics for imaging detectors

TL;DR: In this paper, the noise limits as a function of detector capacitance and power dissipation are presented for CMOS technology for active matrix flat panel imagers (AMFPIs) and their potential noise performance is illustrated.
References
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Journal ArticleDOI

Charge coupled semiconductor devices

TL;DR: A new semiconductor device concept that consists of storing charge in potential wells created at the surface of a semiconductor and moving the charge over the surface by moving the potential minima is described.
Journal ArticleDOI

Parameter estimation in X-ray astronomy

TL;DR: In this paper, the problems of model classification and parameter estimation are examined, with the objective of establishing the statistical reliability of inferences drawn from X-ray observations, and a procedure based on minimizing the chi/sup 2/ statistic is recommended; it provides a rejection criterion at any desired significance level.
Journal ArticleDOI

Scattering by ionization and phonon emission in semiconductors

TL;DR: In this paper, the pair-number probability distribution of a particle with energy $E$ ultimately creates pairs, is calculated recursively with increasing energy, and the first and second moments of the distribution yield pair-creation energy, the Fano factor, and quantum yield for semiconductors.
Journal ArticleDOI

Experimental verification of the charge coupled device concept

TL;DR: To test the assumption that charge transfer efficiencies greater than 98 percent for transfer times less than 100 nsec were observed, devices were fabricated and measurements made.
Journal ArticleDOI

The X-ray energy response of silicon Part A. Theory

TL;DR: In this paper, a Monte Carlo model of X-ray energy loss with respect to the energy and temperature dependences of soft X-rays with silicon was proposed, where the average energy required to create an electron-hole pair and the Fano factor were treated as material constants.
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