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Journal ArticleDOI

Spectroscopic ellipsometry characterization of amorphous and crystalline TiO2 thin films grown by atomic layer deposition at different temperatures

TLDR
In this paper, the effect of growth temperature on the optical properties of TiO2 thin films of widely different structural and morphological characteristics were grown on Si (1.0) substrates using ALD by varying the substrate temperature (Ts) in a wide range (50 −°C −≤ −Ts −400°C).
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This article is published in Applied Surface Science.The article was published on 2014-10-01. It has received 55 citations till now. The article focuses on the topics: Amorphous solid & Atomic layer deposition.

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Journal ArticleDOI

Titanium dioxide thin films by atomic layer deposition: a review

TL;DR: In this paper, the authors summarized the advances in research of ALD of titanium dioxide starting from the chemistries of the over 50 different deposition routes developed for TiO2 and the resultant structural characteristics of the films.
Journal ArticleDOI

Charge Carrier Processes and Optical Properties in TiO2 and TiO2-Based Heterojunction Photocatalysts: A Review.

TL;DR: In this paper, the main characteristics and advantages of TiO2 as photocatalyst are described, and the dynamics of photogenerated electrons and holes are reviewed, including energy levels and trapping states, charge separation and charge recombination.
Journal ArticleDOI

Characterization of Electronic Transport through Amorphous TiO2 Produced by Atomic Layer Deposition

TL;DR: In this paper, electrical transport in amorphous titanium dioxide thin films, deposited by atomic layer deposition (ALD), and across heterojunctions of p+-Si|a-TiO2|metal substrates that had various top...
Journal ArticleDOI

Effect of B2O3 addition on optical and structural properties of TiO2 as a new blocking layer for multiple dye sensitive solar cell application (DSSC)

TL;DR: In this paper, the influence of B2O3 dopant on the optical properties was examined by UV-visible spectroscopy and spectroscopic ellipsometry, and the extinction coefficient and optical band gap were extracted by fitting ellipsometric spectra with the double new amorphous model.
Journal ArticleDOI

Photocatalytic TiO2 sol–gel thin films: Optical and morphological characterization

TL;DR: In this article, an optical characterization method based on both the transmission spectrum of a tri-layer optical system and the Tauc-Lorentz dispersion model has been developed and successfully applied to calculate the thickness, optical constants, absorption edges and optical bandgaps of the dip-coated TiO2 films.
References
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Journal Article

Photoelectrochemical cells : Materials for clean energy

Michael Grätzel
- 01 Jan 2001 - 
TL;DR: In this paper, the authors look into the historical background, and present status and development prospects for photoelectrochemical cells, based on nanocrystalline materials and conducting polymer films.
Journal ArticleDOI

Behavior of the Electronic Dielectric Constant in Covalent and Ionic Materials

TL;DR: In this article, a single effectiveoscillator fit was used to analyze refractive-index dispersion data below the interband absorption edge in more than 100 widely different solids and liquids.
Journal ArticleDOI

Surface chemistry of atomic layer deposition: A case study for the trimethylaluminum/water process

TL;DR: In this paper, the surface chemistry of the trimethylaluminum/water ALD process is reviewed, with an aim to combine the information obtained in different types of investigations, such as growth experiments on flat substrates and reaction chemistry investigation on high-surface-area materials.
Journal ArticleDOI

Parameterization of the optical functions of amorphous materials in the interband region

TL;DR: Forouhi and Bloomer as mentioned in this paper presented a parameterization of the optical functions of amorphous semiconductors and insulators in which the imaginary part of the dielectric function e2 is determined by multiplying the Tauc joint density of states by the e2 obtained from the Lorentz oscillator model.
Book

Spectroscopic Ellipsometry: Principles and Applications

TL;DR: In this paper, the authors present an overview of the application of Spectroscopic Ellipsometry in real-time monitoring of thin-film growth and its application in real time monitoring of anisotropic materials.
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