Open AccessProceedings Article
Transition Fault Simulation by Parallel Pattern Single Fault Propagation.
John A. Waicukauski,Eric Lindbloom,Vijay S. Iyengar,Barry K. Rosen +3 more
- pp 542-551
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This article is published in International Test Conference.The article was published on 1986-01-01 and is currently open access. It has received 105 citations till now. The article focuses on the topics: Fault indicator & Fault (power engineering).read more
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VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)
TL;DR: This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time- to-volume.
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VLSI Test Principles and Architectures: Design for Testability
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On the detection of delay faults
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