Journal ArticleDOI
X-ray dynamical diffraction from multilayer Laue lenses with rough interfaces
Reads0
Chats0
TLDR
Yan et al. as discussed by the authors proposed a modeling approach for x-ray dynamical diffraction from multilayer Laue lenses (MLLs) with rough interfaces, which is formulated from the perspective of the physical scattering process, very different from the conventional DWBA formalism.Abstract:
A modeling approach for x-ray dynamical diffraction from multilayer Laue lenses (MLLs) with rough interfaces is developed. Although still based on the principle of the distorted-wave Born approximation (DWBA), this model is formulated from the perspective of the physical scattering process, very different from the conventional DWBA formalism. Using this model, one can study x-ray scattering from rough interfaces in the regime of Fresnel diffraction and in the case of absorptive samples, for example, x-ray dynamical diffraction from MLLs with rough interfaces, which is hard to handle in the framework of the conventional DWBA. Theoretical simulations for various MLLs with rough interfaces are conducted. It is found that interfacial roughness results in a decrease in the local diffraction intensity, where the attenuation factor is a function of the root-mean-square (rms) roughness versus the local zone width ratio. This study shows that if all zones possess an identical rms roughness value that is less than half of the outmost MLL zone width, the focal broadening effect due to roughness is almost unnoticeable, provided that the mean position of the interface does not deviate from the required zone plate law. A further study shows that uncorrelated interfacial roughness can be treated themore » same as interfacial diffusion, in which case a roughness factor similar to the ''Debye-Waller factor'' can be used, and the pseudo-Fourier coefficients of the susceptibility function for an MLL [H. F. Yan et al., Phys. Rev. B 76, 115438 (2007)] have to be multiplied by this factor.« lessread more
Citations
More filters
Journal ArticleDOI
Hard x-ray nanofocusing by multilayer Laue lenses
TL;DR: A comprehensive review of advances in multilayer Laue lens (MLL) is provided in this paper, which includes extensive theoretical modelling on focusing performance, discussion on fabrication challenges, their current capabilities and notable results from x-ray focusing experiments.
Journal ArticleDOI
Two dimensional hard x-ray nanofocusing with crossed multilayer Laue lenses
Hanfei Yan,Volker Rose,Deming Shu,E. Lima,Hyon Chol Kang,Ray Conley,Chian Liu,N. Jahedi,Albert T. Macrander,G. Brian Stephenson,Martin V. Holt,Yong S. Chu,Ming Lu,Jörg Maser +13 more
TL;DR: Two-dimensional nanofocusing by multilayer Laue lenses (MLLs), a type of diffractive optics that is in principle capable of focusing x-rays to 1 nm, is reported.
Journal ArticleDOI
Quantitative x-ray phase imaging at the nanoscale by multilayer Laue lenses
Hanfei Yan,Yong S. Chu,Jörg Maser,Evgeny Nazaretski,Jungdae Kim,Jungdae Kim,Hyon Chol Kang,Jeffrey J. Lombardo,Wilson K. S. Chiu +8 more
TL;DR: This work proposes a highly robust and generic approach based on a Fourier-shift fitting process and demonstrates quantitative phase imaging of a solid oxide fuel cell anode by multilayer Laue lenses (MLLs), which is extremely powerful in correlating the electrode performance with its buried nanoscale interfacial structures.
Journal ArticleDOI
Fabrication of wedged multilayer Laue lenses
Mauro Prasciolu,Adam F. G. Leontowich,Jacek Krzywinski,A. Andrejczuk,Henry N. Chapman,Saša Bajt +5 more
TL;DR: In this article, the angle of diffracting layers smoothly varies in the lens to achieve optimum diffraction efficiency across the entire pupil of the lens, which can be used to extend the achievable numerical aperture of multilayer Laue lenses to reach considerably smaller focal spot sizes.
Journal ArticleDOI
Fabrication of laser deposited high-quality multilayer zone plates for hard X-ray nanofocusing
Christian Eberl,Florian Döring,Tobias Liese,Felix Schlenkrich,Burkhard Roos,Matthias Hahn,Thomas Hoinkes,Arno Rauschenbeutel,Markus Osterhoff,Tim Salditt,Hans-Ulrich Krebs +10 more
TL;DR: In this article, the authors discuss how to overcome limitations of MZP fabrication by PLD by investigating the material systems W/Si, W/ZrO2, and Ta2O5/ZRO2.
References
More filters
Journal ArticleDOI
X-ray and neutron scattering from rough surfaces
TL;DR: It is shown how various well-known asymptotic power laws in S(q) are obtained from the above theory, and the theory is compared with experimental results on x-ray scattering from a polished Pyrex glass surface.
Journal ArticleDOI
Nonspecular x-ray reflection from rough multilayers.
Václav Holý,Tilo Baumbach +1 more
TL;DR: In this article, both in-plane and vertical correlations of the roughness profiles have been considered and it has been demonstrated that the vertical roughness correlation substantially affects the nonspecular scattering.
Journal ArticleDOI
Grazing-incidence diffraction and the distorted-wave approximation for the study of surfaces
TL;DR: In this article, a method is developed for calculating the scattering of a beam of x rays striking the plane surface of a crystal at an angle below the critical angle for total external reflection.
Journal ArticleDOI
Hard x-ray nanoprobe based on refractive x-ray lenses
Christian G. Schroer,O. Kurapova,Jens Patommel,P. Boye,J. M. Feldkamp,Bruno Lengeler,Manfred Burghammer,Christian Riekel,Laszlo Vincze,A. van der Hart,M. Küchler +10 more
TL;DR: Based on nanofocusing refractive x-ray lenses, a hard xray scanning microscope is currently being developed and is being implemented at beamline ID13 of the European Synchrotron Radiation Facility (Grenoble, France).
Journal ArticleDOI
Nanometer linear focusing of hard x rays by a multilayer Laue lens.
Hyon Chol Kang,Jörg Maser,G. B. Stephenson,Chian Liu,R. Conley,Albert T. Macrander,Stefan Vogt +6 more
TL;DR: A type of linear zone plate for nanometer-scale focusing of hard x rays, a multilayer Laue lens (MLL), produced by sectioning a multILayer and illuminating it in Laue diffraction geometry, indicates that focusing to 5 nm or smaller with high efficiency should be possible.