A
A. Kasic
Researcher at Leipzig University
Publications - 12
Citations - 753
A. Kasic is an academic researcher from Leipzig University. The author has contributed to research in topics: Ellipsometry & Phonon. The author has an hindex of 7, co-authored 12 publications receiving 722 citations. Previous affiliations of A. Kasic include Linköping University.
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Journal ArticleDOI
Infrared dielectric functions and phonon modes of high-quality ZnO films
N. Ashkenov,B. N. Mbenkum,Carsten Bundesmann,V. Riede,Michael Lorenz,Daniel Spemann,E. M. Kaidashev,E. M. Kaidashev,A. Kasic,Mathias Schubert,Marius Grundmann,Gerald Wagner,Horst Neumann,Vanya Darakchieva,Hans Arwin,Bo Monemar +15 more
TL;DR: In this paper, a single crystalline and highly resistive wurtzite ZnO films were obtained from infrared (300-1200 cm−1) spectroscopic ellipsometry and Raman scattering studies.
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Strain-related structural and vibrational properties of thin epitaxial AlN layers
Vanya Darakchieva,Jens Birch,Mathias Schubert,Tanja Paskova,Sukkaneste Tungasmita,Gerald Wagner,A. Kasic,Bo Monemar +7 more
TL;DR: The effect of film thickness on the strain and structural properties of thin epitaxial AIN films has been investigated by high resolution x-ray diffraction techniques and transmission electron micr... as discussed by the authors.
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Disorder-activated infrared modes and surface depletion layer in highly Si-doped hexagonal GaN
TL;DR: In this paper, three infrared-active low-polar modes are reported for highly Si-doped hexagonal (α-) GaN epilayers with free-electron concentration N⩾8×1018 cm−3.
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Optical phonon modes and interband transitions in cubic Al x Ga 1 − x N films
TL;DR: In this article, a comprehensive study of the phonon mode behavior and optical interband transitions of cubic cubic GaN films was performed using spectroscopic ellipsometry from the midinfrared to the vacuum-ultraviolet spectral range (0.05-8.5 eV).
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Phonons and free-carrier properties of binary, ternary, and quaternary group-III nitride layers measured by Infrared Spectroscopic Ellipsometry
A. Kasic,A. Kasic,Mathias Schubert,Jürgen Off,Jürgen Off,B. Kuhn,B. Kuhn,F. Scholz,F. Scholz,Sven Einfeldt,T. Böttcher,Detlef Hommel,Donat Josef As,U. Köhler,Armin Dadgar,Alois Krost,Yoshiki Saito,Yasushi Nanishi,Maria R. Correia,Sérgio Pereira,Vanya Darakchieva,Bo Monemar,Hiroshi Amano,Isamu Akasaki,Gerald Wagner +24 more
TL;DR: In this paper, the authors employed Spectroscopic Ellipsometry in the mid-infrared range to determine phonon and free-carrier properties of individual group-III nitride heterostructure components, including layers of some ten nanometer thickness.