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Ali Javey

Researcher at University of California, Berkeley

Publications -  434
Citations -  61394

Ali Javey is an academic researcher from University of California, Berkeley. The author has contributed to research in topics: Carbon nanotube & Silicon. The author has an hindex of 109, co-authored 409 publications receiving 51886 citations. Previous affiliations of Ali Javey include University of California & Old Dominion University.

Papers
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Proceedings ArticleDOI

Metal Nanoparticle Hole Contacts for Silicon Solar Cells

TL;DR: In this article, the use of a sparse layer of platinum nanoparticles to enhance the hole contact characteristics of a c-Si/transparent conductive oxide hole contact was investigated, and it was shown that the addition of the Pt nanoparticle layer results in a 2 order of magnitude reduction in contact resistivity on both lightly and heavily doped p-type surfaces.
Journal ArticleDOI

Advanced TEM characterization of new electrical contacts for high efficiency c-Si solar cells

TL;DR: In this paper, the authors present a PV center, Swiss Center for Electronics and Microtechnology, Neuchâtel, Switzerland, and a thin-film electronics laboratory, Ecole Polytechnique Fédérale de Lausanne.

Contact for Silicon Heterojunction Solar Cells

TL;DR: In this paper, the authors demonstrate a silicon hetero-junction solar cell with a high open-circuit voltage of 711 mV and a power conversion efficiency of 18.8%.
Posted Content

Highly Quantum-Confined InAs Nanoscale Membranes

TL;DR: In this article, the dominant role of quantum confinement in the field effect device properties of free-standing InAs nanomembranes with varied thicknesses of 5-50 nm was investigated.
Proceedings ArticleDOI

In Situ Transmission Electron Microscopy: A Powerful Tool for the Characterization of Carrier-Selective Contacts

TL;DR: In this article, the thermal stability of various transition metal oxide-based contacts used as carrier-selective contacts in silicon solar cells was investigated using a combination of in situ transmission electron microscopy and transmission line measurements (TLM).