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Eric M. Gullikson

Researcher at Lawrence Berkeley National Laboratory

Publications -  424
Citations -  15937

Eric M. Gullikson is an academic researcher from Lawrence Berkeley National Laboratory. The author has contributed to research in topics: Extreme ultraviolet lithography & Extreme ultraviolet. The author has an hindex of 45, co-authored 412 publications receiving 14639 citations. Previous affiliations of Eric M. Gullikson include University of California, San Diego & University of California, Berkeley.

Papers
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Proceedings ArticleDOI

Normal incidence optics for solar coronal imaging

Eberhard Spiller, +5 more
TL;DR: In this paper, two new normal incidence soft x-ray telescope mirrors coated for lambda equals 63.5 angstrom wavelength were produced for the Space Weather and Terrestrial Hazards (SWATH) satellite and for launch by sounding rocket (NIXT).
Journal Article

Determining the depth distribution of RIXS excitations through standing-wave excitation

S.-C. Lin, +17 more
- 13 Mar 2017 - 
Journal ArticleDOI

Total Electron Yield Ratios between Sample Components in Total-Electron-Yield Soft X-ray Absorption Spectroscopy

Yasuji Muramatsu, +1 more
- 01 Jan 2010 - 
TL;DR: TEY-XASXAS as mentioned in this paper is an advanced light source system that uses a two-stage light source with two generators and two generators. Buttey's XAS is not suitable for outdoor applications.
Journal ArticleDOI

Slow-proton reemission from noble-gas solids.

Allen P. Mills, +5 more
- 01 Oct 1990 - 
TL;DR: A 1-{mu}sec pulsed proton beam is being used to study H{sup +} thermalization and reemission from solid target surfaces in ultrahigh vacuum in order to help clarify analogous experiments using muon beams.
Journal ArticleDOI

Investigation of surface topology of printed nanoparticle layers using wide-angle low-Q scattering.

Emmanuel O. Jonah, +4 more
- 01 May 2014 - 
TL;DR: A new small-angle scattering technique in reflection geometry is described which enables a topological study of rough surfaces by using long-wavelength soft X-rays which are scattered at wide angles but in the low-Q range normally associated with small-angles scattering.