F
Francesco de Paulis
Researcher at University of L'Aquila
Publications - 89
Citations - 944
Francesco de Paulis is an academic researcher from University of L'Aquila. The author has contributed to research in topics: Capacitance & Equivalent circuit. The author has an hindex of 14, co-authored 89 publications receiving 707 citations. Previous affiliations of Francesco de Paulis include Missouri University of Science and Technology.
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Signal/Power Integrity Analysis for Multilayer Printed Circuit Boards Using Cascaded S-Parameters
TL;DR: In this article, a cascaded S-parameter method is proposed for signal/power integrity analysis of multiple vias in a multilayer printed circuit board (PCB), which enables efficient and accurate construction and simulation of physics-based via model for complex multi-layer PCB structures involving vias.
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Impact of Shorting Vias Placement on Embedded Planar Electromagnetic BandGap Structures Within Multilayer Printed Circuit Boards
TL;DR: In this article, the authors investigated the power integrity behavior of planar EBG structures embedded between two solid layers within the stack-up of a multilayer printed circuit board and found that the bandgap generation and power integrity performance of the embedded EBG can be achieved only by placing vias shorting the solid planes above and below the patterned layer.
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Through Silicon Via (TSV) Defect Modeling, Measurement, and Analysis
Daniel H. Jung,Youngwoo Kim,Jonghoon J. Kim,Heegon Kim,Sumin Choi,Yoon-Ho Song,Hyun-Cheol Bae,Kwang-Seong Choi,Stefano Piersanti,Francesco de Paulis,Antonio Orlandi,Joungho Kim +11 more
TL;DR: In this article, the authors proposed a noninvasive defect analysis method for high-speed TSV channel with designed and fabricated test vehicles, and the proposed method is demonstrated with time-domain reflectometry measurement results.
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Near-Field Shielding Performances of EMI Noise Suppression Absorbers
Stefano Piersanti,Francesco de Paulis,Antonio Orlandi,Samuel Connor,Qian Liu,Bruce Archambeault,Paul Francis Dixon,Mohammad Ali Khorrami,James L. Drewniak +8 more
TL;DR: In this paper, the authors describe a systematic study on the near-field behavior of an electromagnetic interference (EMI) noise suppression absorber materials considering two different types of commercial absorbers and different kinds of excitation source: at first, elementary electric dipole and elementary magnetic loop, and then using real dimensions of a coaxial cable for designing a dipole.
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Transient Analysis of TSV Equivalent Circuit Considering Nonlinear MOS Capacitance Effects
TL;DR: In this paper, an equivalent circuit model for the transient analysis of through-silicon vias (TSV) taking into account nonlinear metaloxide-semiconductor effects is proposed.