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Juan A. Lenero-Bardallo

Researcher at University of Seville

Publications -  66
Citations -  555

Juan A. Lenero-Bardallo is an academic researcher from University of Seville. The author has contributed to research in topics: Image sensor & Pixel. The author has an hindex of 10, co-authored 54 publications receiving 448 citations. Previous affiliations of Juan A. Lenero-Bardallo include Spanish National Research Council & University of Cádiz.

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A 3.6 $\mu$ s Latency Asynchronous Frame-Free Event-Driven Dynamic-Vision-Sensor

TL;DR: The ability of the sensor to capture very fast moving objects, rotating at 10 K revolutions per second, has been verified experimentally and a compact preamplification stage has been introduced that allows to improve the minimum detectable contrast over previous designs.
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A Five-Decade Dynamic-Range Ambient-Light-Independent Calibrated Signed-Spatial-Contrast AER Retina With 0.1-ms Latency and Optional Time-to-First-Spike Mode

TL;DR: A spatial-contrast AER contrast retina with a signed output that shows much less mismatch, is almost insensitive to ambient light illumination, and biasing is much less critical than in the original voltage biasing scheme is presented.
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Bio-Inspired Asynchronous Pixel Event Tricolor Vision Sensor

TL;DR: The potential of the first ever prototype of a vision sensor that combines tricolor stacked photo diodes with the bio-inspired asynchronous pixel event communication protocol known as Address Event Representation (AER) is investigated.
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A Bio-Inspired Vision Sensor With Dual Operation and Readout Modes

TL;DR: A new approach to compute the spatial contrast based on inter-pixel event communication less prone to mismatch effects than diffusive networks is proposed.
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A Calibration Technique for Very Low Current and Compact Tunable Neuromorphic Cells: Application to 5-bit 20-nA DACs

TL;DR: A new calibration approach not based on ladders, but on individually calibratable current sources made with MOS transistors of digitally adjustable length, which require only N-sized transistors, allows to expand the operating range of the calibrated circuits with graceful precision degradation, over four decades of operating currents.