M
M.S. Akbar
Researcher at University of Texas at Austin
Publications - 33
Citations - 720
M.S. Akbar is an academic researcher from University of Texas at Austin. The author has contributed to research in topics: Electron mobility & High-κ dielectric. The author has an hindex of 15, co-authored 32 publications receiving 708 citations. Previous affiliations of M.S. Akbar include SEMATECH.
Papers
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Journal ArticleDOI
Bias-temperature instabilities of polysilicon gate HfO/sub 2/ MOSFETs
K. Onishi,Rino Choi,Chang Seok Kang,Hag-Ju Cho,Young Hee Kim,R.E. Nieh,Jeong Han,S. Krishnan,M.S. Akbar,J.C. Lee +9 more
TL;DR: In this article, the bias-temperature instabilities (BTI) of HfO/sub 2/ metal oxide semiconductor field effect transistors (MOSFETs) have been systematically studied for the first time.
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The electrical and material characterization of hafnium oxynitride gate dielectrics with TaN-gate electrode
Chang Seok Kang,Hag-Ju Cho,Rino Choi,Young Hee Kim,Chang Yong Kang,Se Jong Rhee,Chang Hwan Choi,M.S. Akbar,J.C. Lee +8 more
TL;DR: In this paper, the electrical and material characteristics of HfON gate dielectrics have been studied in comparison with HfO/sub 2/ by secondary ion mass spectroscopy (SIMS).
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High-performance TaN/HfSiON/Si metal-oxide-semiconductor structures prepared by NH3 post-deposition anneal
M.S. Akbar,Sundararaman Gopalan,Hag-Ju Cho,Katsunori Onishi,Rino Choi,R. Nieh,C. S. Kang,Yonghyun Kim,Jeong Han,S. Krishnan,Jack C. Lee +10 more
TL;DR: In this article, metal-oxide semiconductor field effect transistors (MOSFETs) prepared by low-thermal-budget NH3 post-deposition annealing of HfSiON gate dielectric have been investigated.
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Electrical characterization and material evaluation of zirconium oxynitride gate dielectric in TaN-gated NMOSFETs with high-temperature forming gas annealing
R. Nieh,Chang Seok Kang,Hag-Ju Cho,Katsunori Onishi,Rino Choi,S. Krishnan,Jeong Hee Han,Young Hee Kim,M.S. Akbar,J.C. Lee +9 more
TL;DR: In this paper, the electrical, material, and reliability characteristics of Zr-oxynitride gate dielectrics were evaluated, and the results revealed higher dielectric strength and effective breakdown field.
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Thickness dependence of Weibull slopes of HfO 2 gate dielectrics
Young Hee Kim,Katsunori Onishi,Chang Seok Kang,Hag-Ju Cho,Rino Choi,S. Krishnan,M.S. Akbar,J.C. Lee +7 more
TL;DR: In this article, the breakdown voltage distribution, Weibull slopes, and area scaling factors have been investigated for HfO/sub 2/ gate dielectrics in order to gain a better understanding of the breakdown mechanism.