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Mirgender Kumar

Researcher at Yeungnam University

Publications -  61
Citations -  839

Mirgender Kumar is an academic researcher from Yeungnam University. The author has contributed to research in topics: Threshold voltage & Subthreshold conduction. The author has an hindex of 11, co-authored 61 publications receiving 556 citations. Previous affiliations of Mirgender Kumar include Indian Institute of Technology (BHU) Varanasi & Indian Institutes of Technology.

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A Compact 2-D Analytical Model for Electrical Characteristics of Double-Gate Tunnel Field-Effect Transistors With a SiO 2 /High- $k$ Stacked Gate-Oxide Structure

TL;DR: In this article, a 2D analytical model for electrical characteristics such as surface potential, drain current, and threshold voltage of double-gate tunnel FETs with a SiO2/High- ${k}$ stacked gate-oxide structure is proposed.
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2-D Analytical Modeling of Threshold Voltage for Graded-Channel Dual-Material Double-Gate MOSFETs

TL;DR: In this article, a 2D analytical model for the surface potential and threshold voltage of graded-channel dual-material double-gate (GCDMDG) MOSFETs obtained by intermixing the concepts of graded doping in channel and dual material in gate engineering has been proposed.
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Effects of Electrostatically Doped Source/Drain and Ferroelectric Gate Oxide on Subthreshold Swing and Impact Ionization Rate of Strained-Si-on-Insulator Tunnel Field-Effect Transistors

TL;DR: In this paper, an electrostatically doped source/drain (EDSD) ferroelectric strained-Si-on-insulator (Fe-SSOI) tunnel field effect transistor (TFET) with the subthreshold swing (SS) as low as 10mV/dec for sub-30nm applications was reported.
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An Analytical Threshold Voltage Model for Triple-Material Cylindrical Gate-All-Around (TM-CGAA) MOSFETs

TL;DR: In this paper, an analytical threshold voltage model is proposed for a triple-material cylindrical gate-all-around MOSFET considering parabolic approximation of the potential along the radial axis.
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Annealing temperature dependent investigations on nano-cauliflower like structure of CdO thin film grown by sol–gel method

TL;DR: In this paper, the crystal structure and surface morphology have been investigated using X-ray diffraction (XRD) and scanning electron microscope (SEM) respectively, and the Urbach energy is calculated for measuring the disorder in thin films for different annealed thin films along with Raman spectra of the thin film to check the crystal structural of CdO thin films.