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Philip L. Trouilloud

Researcher at IBM

Publications -  83
Citations -  4376

Philip L. Trouilloud is an academic researcher from IBM. The author has contributed to research in topics: Magnetization & Tunnel magnetoresistance. The author has an hindex of 27, co-authored 80 publications receiving 4154 citations. Previous affiliations of Philip L. Trouilloud include GlobalFoundries & Centre national de la recherche scientifique.

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Journal ArticleDOI

Exchange-biased magnetic tunnel junctions and application to nonvolatile magnetic random access memory (invited)

TL;DR: In this paper, exchange biased magnetic tunnel junction (MTJ) structures are shown to have useful properties for forming magnetic memory storage elements in a novel cross-point architecture, which exhibit very large magnetoresistive (MR) values exceeding 40% at room temperature, with specific resistance values ranging down to as little as ∼60 Ω(μm)2.
Journal ArticleDOI

Grain-boundary effects on the magnetoresistance properties of perovskite manganite films

TL;DR: The role of grain boundaries in the magnetoresistance (MR) properties of the manganites has been investigated and the polycrystalline films show large MR over a wide temperature range down to 5 K.
PatentDOI

Thermally assisted MRAM

TL;DR: A thermally assisted magnetoresistive random access memory device (TAS-MRAM) with reduced power for reading and writing was proposed in this article, where the storage and sense ferromagnetic layers include a non-magnetic material to reduce the magnetization of the respective layers.
Patent

Thermally-assisted magnetic random access memory (MRAM)

TL;DR: In this paper, the authors propose to select a storage cell by using a brief pulse of tunnelling current between the intersecting bit and word lines at that cell in order to provide sufficient Joule heating to facilitate a change in the magnetization state of its reversible magnetic layer, which preferably comprises a ferrimagnetic material.
Journal ArticleDOI

Thermally assisted magnetization reversal in submicron-sized magnetic thin films

TL;DR: In this paper, the authors measured the rate of thermally assisted magnetization reversal of submicron-sized magnetic thin films and showed that the reversal proceeds through the annihilation of two domain walls that move from opposite sides of the sample.