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Robert A. Reed
Researcher at Vanderbilt University
Publications - 406
Citations - 9511
Robert A. Reed is an academic researcher from Vanderbilt University. The author has contributed to research in topics: Single event upset & Monte Carlo method. The author has an hindex of 48, co-authored 392 publications receiving 8571 citations. Previous affiliations of Robert A. Reed include United States Naval Research Laboratory & Goddard Space Flight Center.
Papers
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Journal ArticleDOI
X-Ray and Proton Radiation Effects on 40 nm CMOS Physically Unclonable Function Devices
Pan Wang,En Xia Zhang,Kai-Hsin Chuang,Wenjun Liao,Huiqi Gong,Peng Wang,Charles N. Arutt,Kai Ni,Michael W. McCurdy,Ingrid Verbauwhede,Erik Bury,D. Linten,Daniel M. Fleetwood,Ronald D. Schrimpf,Robert A. Reed +14 more
TL;DR: In this article, total ionizing dose effects on a physically unclonable function (PUF) based on CMOS breakdown were investigated on a device irradiated to 2 Mrad(SiO2) with less than 11% change in current ratio at 1.2 V.
Journal ArticleDOI
Interfacial Effects on the Optical Properties of CdTe/CdS Quantum Dots
Girija Gaur,Dmitry S. Koktysh,Daniel M. Fleetwood,Robert A. Weller,Robert A. Reed,Sharon M. Weiss +5 more
TL;DR: In this article, the effects of interfacial conditions on the radiative lifetimes and photoluminescence intensities of colloidal CdTe/CdS quantum dots (QDs) embedded in a three-dimensional nanostructured silicon (NSi) matrix was studied.
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Charge Collection Mechanisms of Ge-Channel Bulk $p$ MOSFETs
Isaak K. Samsel,En Xia Zhang,Andrew L. Sternberg,Kai Ni,Robert A. Reed,Daniel M. Fleetwood,Michael L. Alles,Ronald D. Schrimpf,Dimitri Linten,Jerome Mitard,Liesbeth Witters,Nadine Collaert +11 more
TL;DR: In this article, the authors report polarity reversal in SiGe MOS devices with ultrathin quantum well channels due to the favorability of prompt hole collection by either the source or drain region, depending on the strike location.
Journal ArticleDOI
Analysis of TPA Pulsed-Laser-Induced Single-Event Latchup Sensitive-Area
Peng Wang,Andrew L. Sternberg,John A. Kozub,En Xia Zhang,Nathaniel A. Dodds,Scott L. Jordan,Daniel M. Fleetwood,Robert A. Reed,Ronald D. Schrimpf +8 more
TL;DR: In this paper, two-photon absorption (TPA) pulsed-laser testing is used to analyze the TPA-induced single-event latchup sensitive-area of a specially designed test structure.
Journal ArticleDOI
Radiation Response and Adaptive Control-Based Degradation Mitigation of MEMS Accelerometers in Ionizing Dose Environments
E. Bryn Pitt,Eric J. Barth,Z. J. Diggins,Nagabhushan Mahadevan,Gabor Karsai,Brian D. Sierawski,Robert A. Reed,Ronald D. Schrimpf,Robert A. Weller,Michael L. Alles,Arthur F. Witulski +10 more
Abstract: This paper investigates the effects of gamma radiation on the operation of commercially available capacitive microelectromechanical accelerometers intended for use in robotic systems deployed for nuclear disaster remediation. Radiation-induced accelerometer degradation is examined in terms of its effects on the input–output relationship of ADXL325 accelerometers (Analog Devices, Inc., Norwood, Massachusetts, USA) prior to sensor failure. Results show a moderate increase in sensor nonlinearity as well as significant, non-monotonic changes to accelerometer axis sensitivity and zero- $g$ bias. Both part-to-part variation and axis-to-axis variation within individual accelerometers are observed. The effects of the observed accelerometer degradation on the performance of a simple robotic manipulator that relies on acceleration feedback are evaluated in simulation. Additionally, using tools derived from adaptive control theory, this paper presents a real-time recalibration technique for mitigating the effects of the measured accelerometer degradation on the performance of robotic systems that can be applied in-field, without the knowledge of the degradation mechanisms. An example implementation of this technique is also evaluated. Results suggest that control-based strategies for mitigating hardware degradation may be able to extend the useful operating lifetime of non-radiation-hardened sensors in robotic systems deployed in extreme radiation environments.