S
S.L.J. Gierkink
Researcher at Agere Systems
Publications - 38
Citations - 1777
S.L.J. Gierkink is an academic researcher from Agere Systems. The author has contributed to research in topics: Phase noise & Voltage-controlled oscillator. The author has an hindex of 14, co-authored 38 publications receiving 1736 citations. Previous affiliations of S.L.J. Gierkink include University of Twente & Philips.
Papers
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Journal ArticleDOI
Frequency dependence on bias current in 5 GHz CMOS VCOs: impact on tuning range and flicker noise upconversion
Salvatore Levantino,Carlo Samori,Andrea Bonfanti,S.L.J. Gierkink,Andrea L. Lacaita,V. Boccuzzi +5 more
TL;DR: In this article, a first-order estimation of the tuning curve for MOS-varactor-tuned VCOs is provided, based on which a simplified phase-noise model for double cross-coupled VOCs is derived.
Journal ArticleDOI
A low-phase-noise 5-GHz CMOS quadrature VCO using superharmonic coupling
TL;DR: In this article, a new concept for quadrature coupling of LC oscillators is introduced and demonstrated on a 5 GHz CMOS voltage-controlled oscillator. But the technique is limited to a single oscillator and it is not suitable for a large number of oscillators.
Journal ArticleDOI
Reducing MOSFET 1/f noise and power consumption by switched biasing
TL;DR: Switched biasing is proposed as a technique for reducing the 1/f noise in MOSFET's as discussed by the authors, which exploits an intriguing physical effect: cycling a MOS transistor from strong inversion to accumulation reduces its intrinsic 1 /f noise.
Proceedings Article
Reducing MOSFET 1/f noise and power consumption by "Switched biasing"
TL;DR: In this article, the authors proposed a new circuit technique that exploits an intriguing physical effect: cycling a MOS transistor between strong inversion and accumulation reduces its intrinsic 1/f noise.
Journal ArticleDOI
Intrinsic 1/f device noise reduction and its effect on phase noise in CMOS ring oscillators
TL;DR: In this article, it was shown that the 1/f/sup 3/phase noise is dependent on the gate-source voltage of the MOS transistors in the off state.