S
Sergei V. Kalinin
Researcher at Oak Ridge National Laboratory
Publications - 1069
Citations - 43341
Sergei V. Kalinin is an academic researcher from Oak Ridge National Laboratory. The author has contributed to research in topics: Ferroelectricity & Piezoresponse force microscopy. The author has an hindex of 95, co-authored 999 publications receiving 37022 citations. Previous affiliations of Sergei V. Kalinin include Southern Illinois University Carbondale & Louisiana State University.
Papers
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Computational scanning tunneling microscope image database.
Kamal Choudhary,Kevin F. Garrity,Charles H. Camp,Sergei V. Kalinin,Rama K. Vasudevan,Maxim Ziatdinov,Francesca Tavazza +6 more
TL;DR: In this paper, the authors introduce a systematic database of scanning tunneling microscope (STM) images obtained using density functional theory (DFT) for two-dimensional (2D) materials, calculated using the Tersoff-Hamann method.
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Band Excitation Scanning Probe Microscopies
TL;DR: The traditional approach to SPM measurements, based on detection of cantilever response to a well-defined periodic excitation at a single frequency, has remained virtually identical for almost twenty years.
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Cold-Field Switching in PVDF-TrFE Ferroelectric Polymer Nanomesas
Igor Stolichnov,Peter Maksymovych,Evgeny Mikheev,Sergei V. Kalinin,Alexander K. Tagantsev,Nava Setter +5 more
TL;DR: The extrinsic character of the observed polarization reversal suggests that there is no fundamental bar for lowering the coercive field in ferroelectric polymer nanostructures, which is of importance for their applications in functional electronics.
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Disentangling ferroelectric domain wall geometries and pathways in dynamic piezoresponse force microscopy via unsupervised machine learning.
TL;DR: In this article, a variational autoencoder is used to simplify the elements of the observed domain structure, allowing for rotational invariance, thereby reducing the variability of local polarization distributions to a small number of latent variables.
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Detection of defects in atomic-resolution images of materials using cycle analysis
Oleg S. Ovchinnikov,Oleg S. Ovchinnikov,Andrew O'Hara,Stephen Jesse,Bethany M. Hudak,Bethany M. Hudak,Shize Yang,Andrew R. Lupini,Matthew F. Chisholm,Wu Zhou,Wu Zhou,Sergei V. Kalinin,Albina Y. Borisevich,Sokrates T. Pantelides,Sokrates T. Pantelides +14 more
TL;DR: In this paper, an approach for the automated detection and categorization of structural defects in high-angle annular dark-field Z-contrast (HAADF) scanning-transmission-electron microscopy (STEM) images has been presented.